用本征模式解估计螺旋慢波结构的电导率损失

2008 IEEE International Vacuum Electronics Conference Pub Date : 2008-04-22 DOI:10.1109/IVELEC.2008.4556452

P. Rao, S. K. Datta

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引用次数: 15

摘要

本文提出了一种估算螺旋慢波结构中由于电导率损失和表面光洁度引起的衰减常数的简单方法，该方法使用了通过三维HFSS建模从本征模式解中获得的质量因子和色散特性。该方法已与文献中发表的两种实际结构进行了基准测试，并证明了表面光洁度对衰减常数的影响。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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Estimation of conductivity losses in a helix slow-wave structure using eigen-mode solutions

This paper presents a simple method of estimating the attenuation constant due to conductivity losses and surface finish in a helix slow-wave structure, using the quality factor and dispersion characteristics obtainable from the eigen-mode solutions through 3D HFSS modeling. The method has been benchmarked against two practical structures published in the literature, and effect of surface finish on the attenuation constant is demonstrated.

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2008 IEEE International Vacuum Electronics Conference

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