{"title":"基于机器学习的缺陷预测优化缺陷去除效率","authors":"K. Chakravarty, Jagannath Singh","doi":"10.1109/OCIT56763.2022.00047","DOIUrl":null,"url":null,"abstract":"In current world, complexity and volume of software applications are increasing exponentially. Applications are expected to perform without defects as critical real world transactions are being handled through software design and development. Quality of a software can be impacted by software defects and thus leading to unavoidable high cost and customer dissatisfaction. Preventing defects at early stages of development ensures high quality software. Different defect prevention and detection techniques are used to identify the defects before delivery. In the last decade, machine learning models as defect detection techniques have taken a lot of attention from researchers as this concept narrows down the volume of code under inspection. In this research work, six machine learning algorithms are implemented. The prediction results are based on PROMISE public datasets containing more than ten thousand records. Performances of these algorithms have been compared through Confusion Matrix and Area Under the Curve (AUC) of Receiver Characteristic Operator (ROC) which are the most informative indicators of predictive accuracy in software defect prediction. The result analysis shows MLP is the best fit model in both CM and AUC-ROC showing maximum accuracy.","PeriodicalId":425541,"journal":{"name":"2022 OITS International Conference on Information Technology (OCIT)","volume":"10 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2022-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Optimizing Defect Removal Efficiency by Defect Prediction using Machine Learning\",\"authors\":\"K. Chakravarty, Jagannath Singh\",\"doi\":\"10.1109/OCIT56763.2022.00047\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"In current world, complexity and volume of software applications are increasing exponentially. Applications are expected to perform without defects as critical real world transactions are being handled through software design and development. Quality of a software can be impacted by software defects and thus leading to unavoidable high cost and customer dissatisfaction. Preventing defects at early stages of development ensures high quality software. Different defect prevention and detection techniques are used to identify the defects before delivery. In the last decade, machine learning models as defect detection techniques have taken a lot of attention from researchers as this concept narrows down the volume of code under inspection. In this research work, six machine learning algorithms are implemented. The prediction results are based on PROMISE public datasets containing more than ten thousand records. Performances of these algorithms have been compared through Confusion Matrix and Area Under the Curve (AUC) of Receiver Characteristic Operator (ROC) which are the most informative indicators of predictive accuracy in software defect prediction. The result analysis shows MLP is the best fit model in both CM and AUC-ROC showing maximum accuracy.\",\"PeriodicalId\":425541,\"journal\":{\"name\":\"2022 OITS International Conference on Information Technology (OCIT)\",\"volume\":\"10 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2022-12-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2022 OITS International Conference on Information Technology (OCIT)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/OCIT56763.2022.00047\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2022 OITS International Conference on Information Technology (OCIT)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/OCIT56763.2022.00047","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
摘要
当今世界,软件应用程序的复杂性和数量呈指数级增长。当通过软件设计和开发处理关键的现实世界事务时,期望应用程序没有缺陷地执行。软件质量可能受到软件缺陷的影响,从而导致不可避免的高成本和客户不满。在开发的早期阶段防止缺陷可以确保高质量的软件。不同的缺陷预防和检测技术用于在交付前识别缺陷。在过去的十年中,机器学习模型作为缺陷检测技术已经引起了研究人员的广泛关注,因为这个概念缩小了被检查代码的数量。在本研究工作中,实现了六种机器学习算法。预测结果基于包含一万多条记录的PROMISE公共数据集。通过混淆矩阵(Confusion Matrix)和ROC曲线下面积(Area Under the Curve, AUC)对这些算法的性能进行了比较,这是软件缺陷预测中最具信息量的预测精度指标。结果分析表明,MLP是CM和AUC-ROC的最佳拟合模型,准确率最高。
Optimizing Defect Removal Efficiency by Defect Prediction using Machine Learning
In current world, complexity and volume of software applications are increasing exponentially. Applications are expected to perform without defects as critical real world transactions are being handled through software design and development. Quality of a software can be impacted by software defects and thus leading to unavoidable high cost and customer dissatisfaction. Preventing defects at early stages of development ensures high quality software. Different defect prevention and detection techniques are used to identify the defects before delivery. In the last decade, machine learning models as defect detection techniques have taken a lot of attention from researchers as this concept narrows down the volume of code under inspection. In this research work, six machine learning algorithms are implemented. The prediction results are based on PROMISE public datasets containing more than ten thousand records. Performances of these algorithms have been compared through Confusion Matrix and Area Under the Curve (AUC) of Receiver Characteristic Operator (ROC) which are the most informative indicators of predictive accuracy in software defect prediction. The result analysis shows MLP is the best fit model in both CM and AUC-ROC showing maximum accuracy.