用于高分辨率电容和阻抗测量的先进仪器

{"title":"用于高分辨率电容和阻抗测量的先进仪器","authors":"G. Ferrari, M. Carminati","doi":"10.1201/B22451-6","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":308289,"journal":{"name":"Capacitance Spectroscopy of Semiconductors","volume":"37 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2018-07-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"Advanced Instrumentation for High-Resolution Capacitance and Impedance Measurements\",\"authors\":\"G. Ferrari, M. Carminati\",\"doi\":\"10.1201/B22451-6\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"\",\"PeriodicalId\":308289,\"journal\":{\"name\":\"Capacitance Spectroscopy of Semiconductors\",\"volume\":\"37 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2018-07-06\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Capacitance Spectroscopy of Semiconductors\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1201/B22451-6\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Capacitance Spectroscopy of Semiconductors","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1201/B22451-6","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}