M. Savin, A. Grishko, V. Zuev, I. Kochegarov, E.M. Solov'eva
{"title":"用间接参数监测器件可操作性时场效应晶体管故障分析","authors":"M. Savin, A. Grishko, V. Zuev, I. Kochegarov, E.M. Solov'eva","doi":"10.21685/2307-4205-2022-1-10","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":119404,"journal":{"name":"Reliability & Quality of Complex Systems","volume":"74 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"ANALYSIS OF FAILURES OF FIELD-EFFECT TRANSISTORS WHEN MONITORING THE OPERABILITY OF THE DEVICE BY INDIRECT PARAMETERS\",\"authors\":\"M. Savin, A. Grishko, V. Zuev, I. Kochegarov, E.M. Solov'eva\",\"doi\":\"10.21685/2307-4205-2022-1-10\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"\",\"PeriodicalId\":119404,\"journal\":{\"name\":\"Reliability & Quality of Complex Systems\",\"volume\":\"74 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1900-01-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Reliability & Quality of Complex Systems\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.21685/2307-4205-2022-1-10\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Reliability & Quality of Complex Systems","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.21685/2307-4205-2022-1-10","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}