{"title":"提议的数字系统ATE","authors":"E. Saad, I.E. Talkhan, I. M. Sayed","doi":"10.1109/NRSC.1996.551113","DOIUrl":null,"url":null,"abstract":"An ATE-system that can perform digital system testing to localize the faulty part is developed. The test system strategy is based on system and/or board partitioning and hierarchical testing. Testing takes place automatically by software programs within complete test packages including test models, test simulation, fault detection and fault diagnosis.","PeriodicalId":127585,"journal":{"name":"Thirteenth National Radio Science Conference. NRSC '96","volume":"4 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1996-03-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"8","resultStr":"{\"title\":\"A proposed ATE for digital systems\",\"authors\":\"E. Saad, I.E. Talkhan, I. M. Sayed\",\"doi\":\"10.1109/NRSC.1996.551113\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"An ATE-system that can perform digital system testing to localize the faulty part is developed. The test system strategy is based on system and/or board partitioning and hierarchical testing. Testing takes place automatically by software programs within complete test packages including test models, test simulation, fault detection and fault diagnosis.\",\"PeriodicalId\":127585,\"journal\":{\"name\":\"Thirteenth National Radio Science Conference. NRSC '96\",\"volume\":\"4 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1996-03-19\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"8\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Thirteenth National Radio Science Conference. NRSC '96\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/NRSC.1996.551113\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Thirteenth National Radio Science Conference. NRSC '96","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/NRSC.1996.551113","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
An ATE-system that can perform digital system testing to localize the faulty part is developed. The test system strategy is based on system and/or board partitioning and hierarchical testing. Testing takes place automatically by software programs within complete test packages including test models, test simulation, fault detection and fault diagnosis.
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