{"title":"一种基于SOI EEPROM的配置单元,具有简单的擦洗检测","authors":"Kashfia Haque, P. Beckett","doi":"10.1109/VLSID.2011.50","DOIUrl":null,"url":null,"abstract":"We present a Silicon-on-Insulator based circuit for use as configuration storage in a radiation hard reconfigurable system. A non-volatile storage cell, manufacturable in a standar single polysilicon SOI CMOS process with no special layers, is combined with a Schmitt sense amplifier such that the overall block exhibits two unique characteristics that enhance its resistance to radiation induced upsets. Firstly, it is impossible for a radiation-induced event to permanently flip the configuration state. Secondly, a partial de-programming resulting in a reduction in the magnitude of the storage cell voltage causes a large change in static current that can be very easily detected using a conventional sense amplifier. A memory correction (scrubbing) system that exploits this behavior is briefly described.","PeriodicalId":371062,"journal":{"name":"2011 24th Internatioal Conference on VLSI Design","volume":"115 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2011-01-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":"{\"title\":\"A SOI EEPROM Based Configuration Cell with Simple Scrubbing Detection\",\"authors\":\"Kashfia Haque, P. Beckett\",\"doi\":\"10.1109/VLSID.2011.50\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"We present a Silicon-on-Insulator based circuit for use as configuration storage in a radiation hard reconfigurable system. A non-volatile storage cell, manufacturable in a standar single polysilicon SOI CMOS process with no special layers, is combined with a Schmitt sense amplifier such that the overall block exhibits two unique characteristics that enhance its resistance to radiation induced upsets. Firstly, it is impossible for a radiation-induced event to permanently flip the configuration state. Secondly, a partial de-programming resulting in a reduction in the magnitude of the storage cell voltage causes a large change in static current that can be very easily detected using a conventional sense amplifier. A memory correction (scrubbing) system that exploits this behavior is briefly described.\",\"PeriodicalId\":371062,\"journal\":{\"name\":\"2011 24th Internatioal Conference on VLSI Design\",\"volume\":\"115 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2011-01-02\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"3\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2011 24th Internatioal Conference on VLSI Design\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/VLSID.2011.50\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2011 24th Internatioal Conference on VLSI Design","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/VLSID.2011.50","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
A SOI EEPROM Based Configuration Cell with Simple Scrubbing Detection
We present a Silicon-on-Insulator based circuit for use as configuration storage in a radiation hard reconfigurable system. A non-volatile storage cell, manufacturable in a standar single polysilicon SOI CMOS process with no special layers, is combined with a Schmitt sense amplifier such that the overall block exhibits two unique characteristics that enhance its resistance to radiation induced upsets. Firstly, it is impossible for a radiation-induced event to permanently flip the configuration state. Secondly, a partial de-programming resulting in a reduction in the magnitude of the storage cell voltage causes a large change in static current that can be very easily detected using a conventional sense amplifier. A memory correction (scrubbing) system that exploits this behavior is briefly described.