一种基于SOI EEPROM的配置单元,具有简单的擦洗检测

Kashfia Haque, P. Beckett
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引用次数: 3

摘要

我们提出了一种基于绝缘体上硅的电路,用于辐射硬可重构系统的组态存储。非易失性存储单元,可在标准的单多晶硅SOI CMOS工艺中制造,没有特殊的层,与施密特感测放大器相结合,使得整个块具有两个独特的特性,增强了其对辐射诱导扰动的抵抗。首先,辐射引起的事件不可能永久地翻转构型状态。其次,部分反编程导致存储单元电压的幅度降低,导致静态电流的大变化,可以很容易地使用传统的感测放大器检测到。简要描述了一种利用这种行为的记忆修正(清除)系统。
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A SOI EEPROM Based Configuration Cell with Simple Scrubbing Detection
We present a Silicon-on-Insulator based circuit for use as configuration storage in a radiation hard reconfigurable system. A non-volatile storage cell, manufacturable in a standar single polysilicon SOI CMOS process with no special layers, is combined with a Schmitt sense amplifier such that the overall block exhibits two unique characteristics that enhance its resistance to radiation induced upsets. Firstly, it is impossible for a radiation-induced event to permanently flip the configuration state. Secondly, a partial de-programming resulting in a reduction in the magnitude of the storage cell voltage causes a large change in static current that can be very easily detected using a conventional sense amplifier. A memory correction (scrubbing) system that exploits this behavior is briefly described.
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