{"title":"有界寿命集成电路","authors":"Puneet Gupta, A. Kahng","doi":"10.1145/1391469.1391560","DOIUrl":null,"url":null,"abstract":"Integrated circuits with bounded lifetimes can have many business advantages. We give some simple examples of methods to enforce tunable expiration dates for chips using nanometer reliability mechanisms.","PeriodicalId":412696,"journal":{"name":"2008 45th ACM/IEEE Design Automation Conference","volume":"21 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2008-06-08","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":"{\"title\":\"Bounded-lifetime integrated circuits\",\"authors\":\"Puneet Gupta, A. Kahng\",\"doi\":\"10.1145/1391469.1391560\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Integrated circuits with bounded lifetimes can have many business advantages. We give some simple examples of methods to enforce tunable expiration dates for chips using nanometer reliability mechanisms.\",\"PeriodicalId\":412696,\"journal\":{\"name\":\"2008 45th ACM/IEEE Design Automation Conference\",\"volume\":\"21 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2008-06-08\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"2\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2008 45th ACM/IEEE Design Automation Conference\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1145/1391469.1391560\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2008 45th ACM/IEEE Design Automation Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1145/1391469.1391560","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Integrated circuits with bounded lifetimes can have many business advantages. We give some simple examples of methods to enforce tunable expiration dates for chips using nanometer reliability mechanisms.
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