卷对卷过程寄存器误差的数据驱动模型预测控制

Karan Shah, Anqi He, Zifeng Wang, Xian Du, Xiaoning Jin
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引用次数: 0

摘要

卷对卷(R2R)印刷技术适用于基于基材的产品的大批量连续生产,而不是适用于小批量工作的单对单(S2S)印刷方法。然而,满足通常在微米尺度的器件分辨率所规定的增材多层印刷电子器件的严格对准公差要求已成为R2R柔性电子印刷的主要挑战,阻碍了制造技术从传统的S2S转移到高速R2R生产。R2R工艺中的印刷配准是为了在柔性承印物上对齐连续的印刷图案,并通过有效控制各种工艺变量来确保印刷设备的质量。传统的基于模型的控制方法需要精确的卷筒网处理动态模型和实时张力测量,以确保能够忠实地推导出控制律。对于复杂的多级R2R系统,基于物理的状态空间模型很难推导,并且并不总是可以获得实时张力测量。本文提出了一种新的数据驱动模型预测控制(DD-MPC)方法,可以有效地减少多级寄存器误差。我们证明了DD-MPC可以处理多输入多输出系统,并通过特征系统实现算法(ERA)和观测器卡尔曼滤波识别(OKID)系统识别方法从传感器数据中获得植物模型。此外,所提出的控制方案适用于系统状态部分可测的系统。
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Data-Driven Model Predictive Control for Roll-to-Roll Process Register Error
Roll-to-Roll (R2R) printing techniques are promising for high-volume continuous production of substrate-based products, as opposed to sheet-to-sheet (S2S) approach suited for low-volume work. However, meeting the tight alignment tolerance requirements of additive multi-layer printed electronics specified by device resolution that is usually at micrometer scale has become a major challenge in R2R flexible electronics printing, preventing the fabrication technology from being transferred from conventional S2S to high-speed R2R production. Print registration in a R2R process is to align successive print patterns on the flexible substrate and to ensure quality printed devices through effective control of various process variables. Conventional model-based control methods require an accurate web-handling dynamic model and real-time tension measurements to ensure control laws can be faithfully derived. For complex multistage R2R systems, physics-based state-space models are difficult to derive, and real-time tension measurements are not always acquirable. In this paper, we present a novel data-driven model predictive control (DD-MPC) method to minimize the multistage register errors effectively. We show that the DD-MPC can handle multi-input and multi-output systems and obtain the plant model from sensor data via an Eigensystem Realization Algorithm (ERA) and Observer Kalman filter identification (OKID) system identification method. In addition, the proposed control scheme works for systems with partially measurable system states.
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