F. M. D. Paula, Marcel Gort, A. Hu, S. Wilton, Jin Yang
{"title":"退格:后硅调试的形式化分析","authors":"F. M. D. Paula, Marcel Gort, A. Hu, S. Wilton, Jin Yang","doi":"10.1109/FMCAD.2008.ECP.9","DOIUrl":null,"url":null,"abstract":"Post-silicon debug is the problem of determining what's wrong when the fabricated chip of a new design behaves incorrectly. This problem now consumes over half of the overall verification effort on large designs, and the problem is growing worse. We introduce a new paradigm for using formal analysis, augmented with some on-chip hardware support, to automatically compute error traces that lead to an observed buggy state, thereby greatly simplifying the post-silicon debug problem. Our preliminary simulation experiments demonstrate the potential of our approach: we can \"backspace\" hundreds of cycles from randomly selected states of some sample designs. Our preliminary architectural studies propose some possible implementations and show that the on-chip overhead can be reasonable. We conclude by surveying future research directions.","PeriodicalId":399042,"journal":{"name":"2008 Formal Methods in Computer-Aided Design","volume":"19 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2008-11-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"85","resultStr":"{\"title\":\"BackSpace: Formal Analysis for Post-Silicon Debug\",\"authors\":\"F. M. D. Paula, Marcel Gort, A. Hu, S. Wilton, Jin Yang\",\"doi\":\"10.1109/FMCAD.2008.ECP.9\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Post-silicon debug is the problem of determining what's wrong when the fabricated chip of a new design behaves incorrectly. This problem now consumes over half of the overall verification effort on large designs, and the problem is growing worse. We introduce a new paradigm for using formal analysis, augmented with some on-chip hardware support, to automatically compute error traces that lead to an observed buggy state, thereby greatly simplifying the post-silicon debug problem. Our preliminary simulation experiments demonstrate the potential of our approach: we can \\\"backspace\\\" hundreds of cycles from randomly selected states of some sample designs. Our preliminary architectural studies propose some possible implementations and show that the on-chip overhead can be reasonable. We conclude by surveying future research directions.\",\"PeriodicalId\":399042,\"journal\":{\"name\":\"2008 Formal Methods in Computer-Aided Design\",\"volume\":\"19 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2008-11-17\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"85\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2008 Formal Methods in Computer-Aided Design\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/FMCAD.2008.ECP.9\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2008 Formal Methods in Computer-Aided Design","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/FMCAD.2008.ECP.9","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Post-silicon debug is the problem of determining what's wrong when the fabricated chip of a new design behaves incorrectly. This problem now consumes over half of the overall verification effort on large designs, and the problem is growing worse. We introduce a new paradigm for using formal analysis, augmented with some on-chip hardware support, to automatically compute error traces that lead to an observed buggy state, thereby greatly simplifying the post-silicon debug problem. Our preliminary simulation experiments demonstrate the potential of our approach: we can "backspace" hundreds of cycles from randomly selected states of some sample designs. Our preliminary architectural studies propose some possible implementations and show that the on-chip overhead can be reasonable. We conclude by surveying future research directions.