{"title":"一种低成本、低功耗的四元LUT单元,用于未来技术的容错应用","authors":"E. Rhod, L. Carro","doi":"10.1109/ISVLSI.2009.34","DOIUrl":null,"url":null,"abstract":"Field Programmable Gate Arrays offer flexibility to program hardware systems together with the possibility to explore any level of parallelism available in the application. Unfortunately, this flexibility costs a huge amount of circuit area necessary to implement all the routing switches and wires. Also, device scaling in new and future technologies brings along a severe increase in the soft error rate of circuits, for combinational and sequential logic. In order to reduce the impact of the wires and switches and cope with SETs in FPGAs, this work proposes a low power voltage-mode quaternary LUT (QLUT) design that uses quaternary logic to reduce the area spent in switches and routing wires. At the same time, the proposed QLUT provides robustness against SETs. Results show that the fault tolerant QLU There proposed detects all faults that can cause an error with significant less area and less power when comparing to the binary correspondent LUT protected with the DWC technique. In order to evaluate how the proposed QLUT will deal with the process variability of sub 90nm technologies, extensive Monte Carlo simulations were performed and these results are here discussed.","PeriodicalId":137508,"journal":{"name":"2009 IEEE Computer Society Annual Symposium on VLSI","volume":"21 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2009-05-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"4","resultStr":"{\"title\":\"A Low Cost Low Power Quaternary LUT Cell for Fault Tolerant Applications in Future Technologies\",\"authors\":\"E. Rhod, L. Carro\",\"doi\":\"10.1109/ISVLSI.2009.34\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Field Programmable Gate Arrays offer flexibility to program hardware systems together with the possibility to explore any level of parallelism available in the application. Unfortunately, this flexibility costs a huge amount of circuit area necessary to implement all the routing switches and wires. Also, device scaling in new and future technologies brings along a severe increase in the soft error rate of circuits, for combinational and sequential logic. In order to reduce the impact of the wires and switches and cope with SETs in FPGAs, this work proposes a low power voltage-mode quaternary LUT (QLUT) design that uses quaternary logic to reduce the area spent in switches and routing wires. At the same time, the proposed QLUT provides robustness against SETs. Results show that the fault tolerant QLU There proposed detects all faults that can cause an error with significant less area and less power when comparing to the binary correspondent LUT protected with the DWC technique. In order to evaluate how the proposed QLUT will deal with the process variability of sub 90nm technologies, extensive Monte Carlo simulations were performed and these results are here discussed.\",\"PeriodicalId\":137508,\"journal\":{\"name\":\"2009 IEEE Computer Society Annual Symposium on VLSI\",\"volume\":\"21 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2009-05-13\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"4\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2009 IEEE Computer Society Annual Symposium on VLSI\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ISVLSI.2009.34\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2009 IEEE Computer Society Annual Symposium on VLSI","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISVLSI.2009.34","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
A Low Cost Low Power Quaternary LUT Cell for Fault Tolerant Applications in Future Technologies
Field Programmable Gate Arrays offer flexibility to program hardware systems together with the possibility to explore any level of parallelism available in the application. Unfortunately, this flexibility costs a huge amount of circuit area necessary to implement all the routing switches and wires. Also, device scaling in new and future technologies brings along a severe increase in the soft error rate of circuits, for combinational and sequential logic. In order to reduce the impact of the wires and switches and cope with SETs in FPGAs, this work proposes a low power voltage-mode quaternary LUT (QLUT) design that uses quaternary logic to reduce the area spent in switches and routing wires. At the same time, the proposed QLUT provides robustness against SETs. Results show that the fault tolerant QLU There proposed detects all faults that can cause an error with significant less area and less power when comparing to the binary correspondent LUT protected with the DWC technique. In order to evaluate how the proposed QLUT will deal with the process variability of sub 90nm technologies, extensive Monte Carlo simulations were performed and these results are here discussed.