成像光谱仪用Teledyne CHROMA HgCdTe探测器的表征

Peter Sullivan, Michael Bernas, E. Liggett, M. Eastwood, R. Green
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引用次数: 8

摘要

成像光谱学对探测器的性能要求很高。动态范围、线性度和灵敏度必须在高帧速率下保持,并且在大焦平面阵列(FPA)格式下必须最小化伪影。在这篇文章中,我们讨论了Teledyne CHROMA HgCdTe FPA在成像光谱仪应用中的应用。在实验室热真空室中对FPA进行了表征,可以测量读取噪声、暗电流、阱容量、线性度和串扰。结果呈现在一系列的工作温度和像素时钟速率。此外,还讨论了100 krad TID的辐射检测结果。这些表征的结果对于利用HgCdTe CHROMA FPA的未来成像光谱仪的设计和性能预测至关重要。
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Characterization of the Teledyne CHROMA HgCdTe detector for imaging spectrometers
Imaging spectroscopy places high demands upon detector performance. The dynamic range, linearity, and sensitivity must be maintained at high frame rates, and artifacts must be minimized across large focal plane array (FPA) formats. In this contribution, we discuss the Teledyne CHROMA HgCdTe FPA in the context of imaging spectrometer applications. The FPA was characterized in a laboratory thermal-vacuum chamber that allowed the read noise, dark current, well capacity, linearity, and crosstalk to be measured. Results are presented across a range of operating temperatures and pixel clock rates. Additionally, the outcomes of radiation testing to 100 krad TID are discussed. The results of these characterizations are critical to the designs and performance predictions of future imaging spectrometers utilizing the HgCdTe CHROMA FPA.
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