Yin-Cheng Chang, Ping-Yi Wang, S. Hsu, Mao-Hsu Yen, Yen-Tang Chang, Chiu-Kuo Chen, D. Chang
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Design of the multifunction IC-EMC test board with off-board probes for evaluating a microcontroller
A multifunction test board is designed for a microcontroller (MCU) testing. This board can be used to verify the function of the MCU by running several basic instructions. Furthermore, six different IC-EMC measurements complied with IEC standards can be performed on the same board by careful design and the preservation of test points with certified off-board probes. The experimental results show the capability of providing the confident measurements up to 1 GHz. Meanwhile, the cost of performing a bunch of different testing methods on implementing various test boards is reduced.
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