限制改装LED灯可靠性的机制分析

C. D. Santi, M. D. Lago, M. Buffolo, M. Meneghini, G. Meneghesso, E. Zanoni
{"title":"限制改装LED灯可靠性的机制分析","authors":"C. D. Santi, M. D. Lago, M. Buffolo, M. Meneghini, G. Meneghesso, E. Zanoni","doi":"10.1109/RTSI.2015.7325087","DOIUrl":null,"url":null,"abstract":"This paper describes one of the first studies of the degradation of retrofit light bulbs based on white GaN light emitting diodes. The results indicate that the lifetime of LED lamps depends mostly on the stability of the driver and optical elements, rather than on the degradation of the LED chips, that have a stable output over stress time. By comparing lamps from four different manufacturers stressed at room and high temperature, we found that (i) long-term stress causes a change of the chromatic properties of the lamps, which is ascribed to the degradation of the phosphors or to the inner LED reflector; (ii) during ageing the LED driver may degrade gradually and/or catastrophically, causing a reduction of the output optical power, or a complete failure; (iii) proper thermal management and heat dissipation reduce the degradation rate; (iv) spectral transmissivity measurements and visual inspection reveal the degradation of the diffusive optical elements, which is induced by the short wavelength side of the LED emission spectrum.","PeriodicalId":294825,"journal":{"name":"International Forum on Research and Technologies for Society and Industry Leveraging a better tomorrow","volume":"21 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2015-11-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Analysis of the mechanisms limiting the reliability of retrofit LED lamps\",\"authors\":\"C. D. Santi, M. D. Lago, M. Buffolo, M. Meneghini, G. Meneghesso, E. Zanoni\",\"doi\":\"10.1109/RTSI.2015.7325087\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper describes one of the first studies of the degradation of retrofit light bulbs based on white GaN light emitting diodes. The results indicate that the lifetime of LED lamps depends mostly on the stability of the driver and optical elements, rather than on the degradation of the LED chips, that have a stable output over stress time. By comparing lamps from four different manufacturers stressed at room and high temperature, we found that (i) long-term stress causes a change of the chromatic properties of the lamps, which is ascribed to the degradation of the phosphors or to the inner LED reflector; (ii) during ageing the LED driver may degrade gradually and/or catastrophically, causing a reduction of the output optical power, or a complete failure; (iii) proper thermal management and heat dissipation reduce the degradation rate; (iv) spectral transmissivity measurements and visual inspection reveal the degradation of the diffusive optical elements, which is induced by the short wavelength side of the LED emission spectrum.\",\"PeriodicalId\":294825,\"journal\":{\"name\":\"International Forum on Research and Technologies for Society and Industry Leveraging a better tomorrow\",\"volume\":\"21 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2015-11-12\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"International Forum on Research and Technologies for Society and Industry Leveraging a better tomorrow\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/RTSI.2015.7325087\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"International Forum on Research and Technologies for Society and Industry Leveraging a better tomorrow","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/RTSI.2015.7325087","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
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摘要

本文介绍了基于白光氮化镓发光二极管的改造灯泡的退化的首批研究之一。结果表明,LED灯的寿命主要取决于驱动器和光学元件的稳定性,而不是LED芯片的退化,它们在应力时间内具有稳定的输出。通过比较四个不同制造商的灯在室温和高温下的应力,我们发现:(1)长期应力导致灯的颜色特性发生变化,这归因于荧光粉的降解或内部LED反射器;(ii)在老化过程中,LED驱动器可能逐渐和/或灾难性地退化,导致输出光功率降低,或完全失效;(iii)适当的热管理和散热可降低降解率;(iv)光谱透射率测量和目视检查揭示了扩散光学元件的退化,这是由LED发射光谱的短波长侧引起的。
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Analysis of the mechanisms limiting the reliability of retrofit LED lamps
This paper describes one of the first studies of the degradation of retrofit light bulbs based on white GaN light emitting diodes. The results indicate that the lifetime of LED lamps depends mostly on the stability of the driver and optical elements, rather than on the degradation of the LED chips, that have a stable output over stress time. By comparing lamps from four different manufacturers stressed at room and high temperature, we found that (i) long-term stress causes a change of the chromatic properties of the lamps, which is ascribed to the degradation of the phosphors or to the inner LED reflector; (ii) during ageing the LED driver may degrade gradually and/or catastrophically, causing a reduction of the output optical power, or a complete failure; (iii) proper thermal management and heat dissipation reduce the degradation rate; (iv) spectral transmissivity measurements and visual inspection reveal the degradation of the diffusive optical elements, which is induced by the short wavelength side of the LED emission spectrum.
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Analysis of the mechanisms limiting the reliability of retrofit LED lamps A semi-graphical modeling framework for the automated analysis of networked systems security
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