针对软错误提高寄存器文件完整性的自免疫技术

H. Amrouch, J. Henkel
{"title":"针对软错误提高寄存器文件完整性的自免疫技术","authors":"H. Amrouch, J. Henkel","doi":"10.1109/VLSID.2011.68","DOIUrl":null,"url":null,"abstract":"Continuous shrinking in feature size, increasing power density etc. increase the vulnerability of microprocessors against soft errors even in terrestrial applications. The register file is one of the essential architectural components where soft errors can be very mischievous because errors may rapidly spread from there throughout the whole system. Thus, register files are recognized as one of the major concerns when it comes to reliability. This paper introduces Self-Immunity, a technique that improves the integrity of the register file with respect to soft errors. Based on the observation that a certain number of register bits are not always used to represent a value stored in a register. This paper deals with the difficulty to exploit this obvious observation to enhance the register file integrity against soft errors. We show that our technique can reduce the vulnerability of the register file considerably while exhibiting smaller overhead in terms of area and power consumption compared to state-of-the-art in register file protection.","PeriodicalId":371062,"journal":{"name":"2011 24th Internatioal Conference on VLSI Design","volume":"88 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2011-01-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"22","resultStr":"{\"title\":\"Self-Immunity Technique to Improve Register File Integrity Against Soft Errors\",\"authors\":\"H. Amrouch, J. Henkel\",\"doi\":\"10.1109/VLSID.2011.68\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Continuous shrinking in feature size, increasing power density etc. increase the vulnerability of microprocessors against soft errors even in terrestrial applications. The register file is one of the essential architectural components where soft errors can be very mischievous because errors may rapidly spread from there throughout the whole system. Thus, register files are recognized as one of the major concerns when it comes to reliability. This paper introduces Self-Immunity, a technique that improves the integrity of the register file with respect to soft errors. Based on the observation that a certain number of register bits are not always used to represent a value stored in a register. This paper deals with the difficulty to exploit this obvious observation to enhance the register file integrity against soft errors. We show that our technique can reduce the vulnerability of the register file considerably while exhibiting smaller overhead in terms of area and power consumption compared to state-of-the-art in register file protection.\",\"PeriodicalId\":371062,\"journal\":{\"name\":\"2011 24th Internatioal Conference on VLSI Design\",\"volume\":\"88 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2011-01-02\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"22\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2011 24th Internatioal Conference on VLSI Design\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/VLSID.2011.68\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2011 24th Internatioal Conference on VLSI Design","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/VLSID.2011.68","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 22

摘要

特征尺寸的不断缩小,功率密度的不断增加等增加了微处理器在地面应用中对软错误的脆弱性。寄存器文件是重要的体系结构组件之一,软错误在其中可能非常有害,因为错误可能会从寄存器文件迅速传播到整个系统。因此,当涉及到可靠性时,寄存器文件被认为是主要关注点之一。本文介绍了一种提高寄存器文件在软错误方面完整性的自免疫技术。基于观察到一定数量的寄存器位并不总是用来表示存储在寄存器中的值。本文讨论了利用这一显而易见的观察结果来提高寄存器文件的完整性以防止软错误的困难。我们表明,与最先进的寄存器文件保护相比,我们的技术可以大大减少寄存器文件的脆弱性,同时在面积和功耗方面表现出更小的开销。
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Self-Immunity Technique to Improve Register File Integrity Against Soft Errors
Continuous shrinking in feature size, increasing power density etc. increase the vulnerability of microprocessors against soft errors even in terrestrial applications. The register file is one of the essential architectural components where soft errors can be very mischievous because errors may rapidly spread from there throughout the whole system. Thus, register files are recognized as one of the major concerns when it comes to reliability. This paper introduces Self-Immunity, a technique that improves the integrity of the register file with respect to soft errors. Based on the observation that a certain number of register bits are not always used to represent a value stored in a register. This paper deals with the difficulty to exploit this obvious observation to enhance the register file integrity against soft errors. We show that our technique can reduce the vulnerability of the register file considerably while exhibiting smaller overhead in terms of area and power consumption compared to state-of-the-art in register file protection.
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