高性能双栅GNR场效应管

N. G. Bheniye, P. Panchal, A. Gajarushi
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引用次数: 0

摘要

三十年来,CMOS技术的规模化发展迅速。但由于某些限制,如最小尺寸,开关性能下降,功耗等,CMOS必然会达到其极限。因此,当达到极限时,可能取代CMOS的技术需要研究。一些潜在的解决方案可以使用新材料,如石墨烯或新结构,如双栅和后门。本文研究了石墨烯纳米带在双栅和背栅结构下的结构和电子性能。仿真结果支持了本文的研究。
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High performance dual gate GNR fet
The scaling of CMOS technology has progressed rapidly for three decades. But CMOS is bound to reach its limits due to certain constraints such as minimum dimensions that can be fabricated, degradation in switching performance, power-dissipation etc. Thus, the technologies that may replace CMOS when the limit is reached need to be investigated. Some of the potential solutions can be use of new materials such as graphene or new structures such as Dual gate and back gate. In this paper we investigate the structural and electronic properties of graphene nano-ribbons when devised into dual gate and back-gate structures. Simulation results have been used to support the paper.
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