{"title":"浸渍电容器元件的击穿强度","authors":"C. Guillermin, S. Fontana","doi":"10.1109/ICD.2016.7547695","DOIUrl":null,"url":null,"abstract":"The dielectric strength of unaged and aged capacitor elements is described using a 2-parameters Weibull statistical analysis. The experimental results suggest that aged elements can be split in two populations. The electric stress at the electrode edge is shown to be an important parameter regarding the decrease of dielectric strength. A threshold value of the stress in this area was determined from the bibliography and is confirmed by the experimental evidence.","PeriodicalId":306397,"journal":{"name":"2016 IEEE International Conference on Dielectrics (ICD)","volume":"140 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2016-07-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":"{\"title\":\"Breakdown strength of impregnated capacitor elements\",\"authors\":\"C. Guillermin, S. Fontana\",\"doi\":\"10.1109/ICD.2016.7547695\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The dielectric strength of unaged and aged capacitor elements is described using a 2-parameters Weibull statistical analysis. The experimental results suggest that aged elements can be split in two populations. The electric stress at the electrode edge is shown to be an important parameter regarding the decrease of dielectric strength. A threshold value of the stress in this area was determined from the bibliography and is confirmed by the experimental evidence.\",\"PeriodicalId\":306397,\"journal\":{\"name\":\"2016 IEEE International Conference on Dielectrics (ICD)\",\"volume\":\"140 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2016-07-03\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"3\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2016 IEEE International Conference on Dielectrics (ICD)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ICD.2016.7547695\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2016 IEEE International Conference on Dielectrics (ICD)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICD.2016.7547695","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Breakdown strength of impregnated capacitor elements
The dielectric strength of unaged and aged capacitor elements is described using a 2-parameters Weibull statistical analysis. The experimental results suggest that aged elements can be split in two populations. The electric stress at the electrode edge is shown to be an important parameter regarding the decrease of dielectric strength. A threshold value of the stress in this area was determined from the bibliography and is confirmed by the experimental evidence.
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