FO(<)均匀性

C. Behle, K. Lange
{"title":"FO(<)均匀性","authors":"C. Behle, K. Lange","doi":"10.1109/CCC.2006.20","DOIUrl":null,"url":null,"abstract":"Uniformity notions more restrictive than the usual FO[<, +, *]-uniformity = FO[<, Bit]-uniformity are introduced. It is shown that the general framework exhibited by Barrington et al. still holds if the fan-in of the gates in the corresponding circuits is considered","PeriodicalId":325664,"journal":{"name":"21st Annual IEEE Conference on Computational Complexity (CCC'06)","volume":"119 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2006-07-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"19","resultStr":"{\"title\":\"FO[<]-uniformity\",\"authors\":\"C. Behle, K. Lange\",\"doi\":\"10.1109/CCC.2006.20\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Uniformity notions more restrictive than the usual FO[<, +, *]-uniformity = FO[<, Bit]-uniformity are introduced. It is shown that the general framework exhibited by Barrington et al. still holds if the fan-in of the gates in the corresponding circuits is considered\",\"PeriodicalId\":325664,\"journal\":{\"name\":\"21st Annual IEEE Conference on Computational Complexity (CCC'06)\",\"volume\":\"119 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2006-07-16\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"19\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"21st Annual IEEE Conference on Computational Complexity (CCC'06)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/CCC.2006.20\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"21st Annual IEEE Conference on Computational Complexity (CCC'06)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/CCC.2006.20","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 19

摘要

引入了比通常的FO[<, +, *]-uniformity更严格的一致性概念= FO[<, Bit]-uniformity。结果表明,如果考虑相应电路中栅极的扇入,Barrington等人展示的一般框架仍然成立
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FO[<]-uniformity
Uniformity notions more restrictive than the usual FO[<, +, *]-uniformity = FO[<, Bit]-uniformity are introduced. It is shown that the general framework exhibited by Barrington et al. still holds if the fan-in of the gates in the corresponding circuits is considered
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