{"title":"辐射高频电磁场抗扰度有效试验方法的发展(IEC 801-3)","authors":"K. Ishihara, K. Matsuo","doi":"10.1109/IMTC.1994.352135","DOIUrl":null,"url":null,"abstract":"For EMC (electromagnetic compatibility) of electronic equipment, it is necessary to not only reduce the electromagnetic waves radiated from the equipment but also raise the resistance against external electromagnetic waves. A test method for checking the level of this resistance against electromagnetic waves is currently under study as IEC Standard 801-3 but it has a big problem in the matter of test efficiency because of an enormous amount of test time required. Under such circumstances, we developed a simple and efficient test method which can be applied without sacrificing the reliability of the test and have the honour of reporting an outline of this method hereafter.<<ETX>>","PeriodicalId":231484,"journal":{"name":"Conference Proceedings. 10th Anniversary. IMTC/94. Advanced Technologies in I & M. 1994 IEEE Instrumentation and Measurement Technolgy Conference (Cat. No.94CH3424-9)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1994-05-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Development of effective test method of radiant high frequency electromagnetic field immunity (IEC 801-3)\",\"authors\":\"K. Ishihara, K. Matsuo\",\"doi\":\"10.1109/IMTC.1994.352135\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"For EMC (electromagnetic compatibility) of electronic equipment, it is necessary to not only reduce the electromagnetic waves radiated from the equipment but also raise the resistance against external electromagnetic waves. A test method for checking the level of this resistance against electromagnetic waves is currently under study as IEC Standard 801-3 but it has a big problem in the matter of test efficiency because of an enormous amount of test time required. Under such circumstances, we developed a simple and efficient test method which can be applied without sacrificing the reliability of the test and have the honour of reporting an outline of this method hereafter.<<ETX>>\",\"PeriodicalId\":231484,\"journal\":{\"name\":\"Conference Proceedings. 10th Anniversary. IMTC/94. Advanced Technologies in I & M. 1994 IEEE Instrumentation and Measurement Technolgy Conference (Cat. No.94CH3424-9)\",\"volume\":\"1 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1994-05-10\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Conference Proceedings. 10th Anniversary. IMTC/94. Advanced Technologies in I & M. 1994 IEEE Instrumentation and Measurement Technolgy Conference (Cat. No.94CH3424-9)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/IMTC.1994.352135\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Conference Proceedings. 10th Anniversary. IMTC/94. Advanced Technologies in I & M. 1994 IEEE Instrumentation and Measurement Technolgy Conference (Cat. No.94CH3424-9)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IMTC.1994.352135","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Development of effective test method of radiant high frequency electromagnetic field immunity (IEC 801-3)
For EMC (electromagnetic compatibility) of electronic equipment, it is necessary to not only reduce the electromagnetic waves radiated from the equipment but also raise the resistance against external electromagnetic waves. A test method for checking the level of this resistance against electromagnetic waves is currently under study as IEC Standard 801-3 but it has a big problem in the matter of test efficiency because of an enormous amount of test time required. Under such circumstances, we developed a simple and efficient test method which can be applied without sacrificing the reliability of the test and have the honour of reporting an outline of this method hereafter.<>