{"title":"铝合金中纳米析出物的原子探针表征","authors":"K. Hono","doi":"10.1201/9781351045636-140000394","DOIUrl":null,"url":null,"abstract":"Atomic Probe Field Ion Microscopy (APFIM) is used to solve many critical problems related to microstructures of metallic materials such as nanostructures that are composed of nanoscale precipitates dispersed in a matrix phase. The atom probe technique provides unique information on metallic nanostructures not attainable with other analytical microscopy techniques such as Transmission Electron Microscopy (TEM). In this article the an overview of the contribution of the atom probe technique to enhance the current understanding of solute clustering and characterization of fine precipitates of aluminum alloys.","PeriodicalId":348912,"journal":{"name":"Encyclopedia of Aluminum and Its Alloys","volume":"15 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2018-11-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Atom Probe Characterization of Nanoscale Precipitates in Aluminum Alloys\",\"authors\":\"K. Hono\",\"doi\":\"10.1201/9781351045636-140000394\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Atomic Probe Field Ion Microscopy (APFIM) is used to solve many critical problems related to microstructures of metallic materials such as nanostructures that are composed of nanoscale precipitates dispersed in a matrix phase. The atom probe technique provides unique information on metallic nanostructures not attainable with other analytical microscopy techniques such as Transmission Electron Microscopy (TEM). In this article the an overview of the contribution of the atom probe technique to enhance the current understanding of solute clustering and characterization of fine precipitates of aluminum alloys.\",\"PeriodicalId\":348912,\"journal\":{\"name\":\"Encyclopedia of Aluminum and Its Alloys\",\"volume\":\"15 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2018-11-16\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Encyclopedia of Aluminum and Its Alloys\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1201/9781351045636-140000394\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Encyclopedia of Aluminum and Its Alloys","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1201/9781351045636-140000394","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Atom Probe Characterization of Nanoscale Precipitates in Aluminum Alloys
Atomic Probe Field Ion Microscopy (APFIM) is used to solve many critical problems related to microstructures of metallic materials such as nanostructures that are composed of nanoscale precipitates dispersed in a matrix phase. The atom probe technique provides unique information on metallic nanostructures not attainable with other analytical microscopy techniques such as Transmission Electron Microscopy (TEM). In this article the an overview of the contribution of the atom probe technique to enhance the current understanding of solute clustering and characterization of fine precipitates of aluminum alloys.