{"title":"用于分析损耗色散耦合GaAs互连线系统的SPICE宏观模型","authors":"Bhaskar Gopalan","doi":"10.1109/VLSID.2011.11","DOIUrl":null,"url":null,"abstract":"A SPICE macro model for the transient analysis of lossy dispersive coupled GaAs interconnect line system is considered. The model is based on finite Fourier integral transform in spatial domain and is used to the study the transient nature of the signals, signal delays, distortions and cross talk in IC interconnections in digital integrated circuits. An equivalent circuit model is derived from the resulting nonlinear differential equations and is implemented as a macro model in a general purpose circuit simulator, SPICE. The model provides an easy method of including skin effect and dispersion of the lines. This macro model is an alternative method to the multiple PI or Tee sections lumped element modeling of distributed systems. The simulation times and accuracy are well compared to the reduced order PI section lumped element models.","PeriodicalId":371062,"journal":{"name":"2011 24th Internatioal Conference on VLSI Design","volume":"78 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2011-01-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"A SPICE Macromodel for the Analysis of Lossy Dispersive Coupled GaAs Interconnect Line System\",\"authors\":\"Bhaskar Gopalan\",\"doi\":\"10.1109/VLSID.2011.11\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A SPICE macro model for the transient analysis of lossy dispersive coupled GaAs interconnect line system is considered. The model is based on finite Fourier integral transform in spatial domain and is used to the study the transient nature of the signals, signal delays, distortions and cross talk in IC interconnections in digital integrated circuits. An equivalent circuit model is derived from the resulting nonlinear differential equations and is implemented as a macro model in a general purpose circuit simulator, SPICE. The model provides an easy method of including skin effect and dispersion of the lines. This macro model is an alternative method to the multiple PI or Tee sections lumped element modeling of distributed systems. The simulation times and accuracy are well compared to the reduced order PI section lumped element models.\",\"PeriodicalId\":371062,\"journal\":{\"name\":\"2011 24th Internatioal Conference on VLSI Design\",\"volume\":\"78 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2011-01-02\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2011 24th Internatioal Conference on VLSI Design\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/VLSID.2011.11\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2011 24th Internatioal Conference on VLSI Design","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/VLSID.2011.11","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
A SPICE Macromodel for the Analysis of Lossy Dispersive Coupled GaAs Interconnect Line System
A SPICE macro model for the transient analysis of lossy dispersive coupled GaAs interconnect line system is considered. The model is based on finite Fourier integral transform in spatial domain and is used to the study the transient nature of the signals, signal delays, distortions and cross talk in IC interconnections in digital integrated circuits. An equivalent circuit model is derived from the resulting nonlinear differential equations and is implemented as a macro model in a general purpose circuit simulator, SPICE. The model provides an easy method of including skin effect and dispersion of the lines. This macro model is an alternative method to the multiple PI or Tee sections lumped element modeling of distributed systems. The simulation times and accuracy are well compared to the reduced order PI section lumped element models.