利用“ZYGO”自动图案处理系统的云纹偏转测量

Workshop on Optical Fabrication and Testing Pub Date : 1900-01-01 DOI:10.1364/oft.1986.tha6

D. Sharma, C. Delisle

{"title":"利用“ZYGO”自动图案处理系统的云纹偏转测量","authors":"D. Sharma, C. Delisle","doi":"10.1364/oft.1986.tha6","DOIUrl":null,"url":null,"abstract":"Moire deflectometry1,2 provides a viable alternative to interferometry for the measurement of ray deflections from a phase object. Being an incoherent technique it is free from stability problems associated with interferometry. Among the other advantages is the simplicity of the setup and use of low quality optics.","PeriodicalId":170034,"journal":{"name":"Workshop on Optical Fabrication and Testing","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Moire Deflectometry Utilizing \\\"ZYGO\\\" Automatic Pattern Processor System\",\"authors\":\"D. Sharma, C. Delisle\",\"doi\":\"10.1364/oft.1986.tha6\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Moire deflectometry1,2 provides a viable alternative to interferometry for the measurement of ray deflections from a phase object. Being an incoherent technique it is free from stability problems associated with interferometry. Among the other advantages is the simplicity of the setup and use of low quality optics.\",\"PeriodicalId\":170034,\"journal\":{\"name\":\"Workshop on Optical Fabrication and Testing\",\"volume\":\"1 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1900-01-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Workshop on Optical Fabrication and Testing\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1364/oft.1986.tha6\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Workshop on Optical Fabrication and Testing","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1364/oft.1986.tha6","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}

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摘要

云纹偏转测量1,2为相位物体的射线偏转测量提供了一种可行的替代干涉测量法。作为一种非相干技术，它不存在与干涉测量相关的稳定性问题。在其他优点是简单的设置和使用低质量的光学。

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Moire Deflectometry Utilizing "ZYGO" Automatic Pattern Processor System

Moire deflectometry1,2 provides a viable alternative to interferometry for the measurement of ray deflections from a phase object. Being an incoherent technique it is free from stability problems associated with interferometry. Among the other advantages is the simplicity of the setup and use of low quality optics.

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Workshop on Optical Fabrication and Testing

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