{"title":"测量系统,分析VTR再现输出波动的原因","authors":"T. Sakai, S. Kondoh, T. Sekiguchi","doi":"10.1109/ICCE.1995.517880","DOIUrl":null,"url":null,"abstract":"We have developed a method to quantitatively measure the VTR reproduced output fluctuation factors using two-frequency time division signals. It has been confirmed, that this method is effective in measuring off-track and spacing fluctuation separately, by a series of experiments.","PeriodicalId":306595,"journal":{"name":"Proceedings of International Conference on Consumer Electronics","volume":null,"pages":null},"PeriodicalIF":0.0000,"publicationDate":"1995-06-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Measuring system to analyze causes of VTR reproduced output fluctuation\",\"authors\":\"T. Sakai, S. Kondoh, T. Sekiguchi\",\"doi\":\"10.1109/ICCE.1995.517880\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"We have developed a method to quantitatively measure the VTR reproduced output fluctuation factors using two-frequency time division signals. It has been confirmed, that this method is effective in measuring off-track and spacing fluctuation separately, by a series of experiments.\",\"PeriodicalId\":306595,\"journal\":{\"name\":\"Proceedings of International Conference on Consumer Electronics\",\"volume\":null,\"pages\":null},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1995-06-07\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings of International Conference on Consumer Electronics\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ICCE.1995.517880\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of International Conference on Consumer Electronics","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICCE.1995.517880","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Measuring system to analyze causes of VTR reproduced output fluctuation
We have developed a method to quantitatively measure the VTR reproduced output fluctuation factors using two-frequency time division signals. It has been confirmed, that this method is effective in measuring off-track and spacing fluctuation separately, by a series of experiments.