{"title":"基于Camera-Link的高速大阵列APS设备测试系统的设计与实现","authors":"Shan Cong, He Wang, Zhang Dayu, Mingchao Chang","doi":"10.1109/IMCCC.2018.00272","DOIUrl":null,"url":null,"abstract":"This paper analyzed the working principle and interface character of the APS image sensor, and designed an APS test system for high-speed and large array APS device based on the Camera-Link interface. The system was made up of several subsystems as lighting control, pattern generator, image data gather and analyze. By using FPGA device, this paper designed the interface of APS to Camera-Link and solved the problem of mass data transfer during APS-testing. By analyzing the output of the APS pixels under different exposure time, this system could test the key specifications of APS device like saturation exposure time, saturation output curve and bad pixels.","PeriodicalId":328754,"journal":{"name":"2018 Eighth International Conference on Instrumentation & Measurement, Computer, Communication and Control (IMCCC)","volume":"5 7 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2018-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Design and Implementation of APS Test System for High-Speed and Large Array APS Device Based on Camera-Link\",\"authors\":\"Shan Cong, He Wang, Zhang Dayu, Mingchao Chang\",\"doi\":\"10.1109/IMCCC.2018.00272\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper analyzed the working principle and interface character of the APS image sensor, and designed an APS test system for high-speed and large array APS device based on the Camera-Link interface. The system was made up of several subsystems as lighting control, pattern generator, image data gather and analyze. By using FPGA device, this paper designed the interface of APS to Camera-Link and solved the problem of mass data transfer during APS-testing. By analyzing the output of the APS pixels under different exposure time, this system could test the key specifications of APS device like saturation exposure time, saturation output curve and bad pixels.\",\"PeriodicalId\":328754,\"journal\":{\"name\":\"2018 Eighth International Conference on Instrumentation & Measurement, Computer, Communication and Control (IMCCC)\",\"volume\":\"5 7 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2018-07-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2018 Eighth International Conference on Instrumentation & Measurement, Computer, Communication and Control (IMCCC)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/IMCCC.2018.00272\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2018 Eighth International Conference on Instrumentation & Measurement, Computer, Communication and Control (IMCCC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IMCCC.2018.00272","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Design and Implementation of APS Test System for High-Speed and Large Array APS Device Based on Camera-Link
This paper analyzed the working principle and interface character of the APS image sensor, and designed an APS test system for high-speed and large array APS device based on the Camera-Link interface. The system was made up of several subsystems as lighting control, pattern generator, image data gather and analyze. By using FPGA device, this paper designed the interface of APS to Camera-Link and solved the problem of mass data transfer during APS-testing. By analyzing the output of the APS pixels under different exposure time, this system could test the key specifications of APS device like saturation exposure time, saturation output curve and bad pixels.