面向接触电阻计算的球形纳米压痕下金表面凹凸变形离散分析

B. Arrazat, P. Duvivier, V. Mandrillon, K. Inal
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引用次数: 15

摘要

MEMS欧姆开关表现出了有趣的性能,部分原因是它们的低接触电阻取决于多种因素,其中之一是接触区域的粗糙度。实际上,接触区域是由具有不同大小、高度和曲率半径的星团组成的。在这项工作中,我们研究了微开关压力范围内的纳米尺度下的离散机械变形。250µN至2 mN的负载由具有球形金刚石尖端的纳米压头施加(48.5µm曲率半径)。通过AFM形貌测量和数字图像处理对得到的接触区域进行了研究。因此,对于每个施加的载荷,将塑性变形模式下的粗糙度进行分类,并用于确定“表面硬度”值,该值与Berkovich纳米压痕测量的硬度一致。最后,将塑性变形模式下识别的凸点作为计算等效微动开关接触电阻的输入。
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Discrete Analysis of Gold Surface Asperities Deformation under Spherical Nano-Indentation Towards Electrical Contact Resistance Calculation
MEMS ohmic switches have demonstrated interesting performances due in part to their low contact resistance which depends on multiple contributions, one amongst them is the roughness of the contact area. In fact, the contact area is composed by clusters asperities that have different sizes, heights and curvature radii. In this work, we investigate the discrete mechanical deformation of asperities at the nano-scale, in the micro-switch pressure range. Loads from 250 µN up to 2 mN are applied by a nano-indenter with a spherical diamond tip (48.5 µm curvature radius). The resulting contact areas are investigated by AFM topography measurements and treated by digital image processing. As a result for each applied loads, the asperities in plastic deformation mode are sorted and used to determine a value of "surface hardness", coherent with the hardness measured by Berkovich nano-indentation. Finally, the asperities identified in plastic deformation mode are used as inputs for the calculation of the electrical contact resistances of equivalent micro-switches.
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