A. Talneau, F. Lemarchand, A. Fehrembach, A. Sentenac
{"title":"毫米尺度光子晶体陷波滤波器光刻不均匀性的影响","authors":"A. Talneau, F. Lemarchand, A. Fehrembach, A. Sentenac","doi":"10.1109/CLEOE-EQEC.2009.5194810","DOIUrl":null,"url":null,"abstract":"We investigate the impact of electronic lithography writing conditions on the performances of two-dimensional grating notch filters fabricated on SiO2/Ta2O5 stack. Field stitching errors as well as electron beam writing step are considered.","PeriodicalId":346720,"journal":{"name":"CLEO/Europe - EQEC 2009 - European Conference on Lasers and Electro-Optics and the European Quantum Electronics Conference","volume":"267 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2009-06-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Impact of lithographic irregularity across mm-scale photonic-crystal notch filters\",\"authors\":\"A. Talneau, F. Lemarchand, A. Fehrembach, A. Sentenac\",\"doi\":\"10.1109/CLEOE-EQEC.2009.5194810\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"We investigate the impact of electronic lithography writing conditions on the performances of two-dimensional grating notch filters fabricated on SiO2/Ta2O5 stack. Field stitching errors as well as electron beam writing step are considered.\",\"PeriodicalId\":346720,\"journal\":{\"name\":\"CLEO/Europe - EQEC 2009 - European Conference on Lasers and Electro-Optics and the European Quantum Electronics Conference\",\"volume\":\"267 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2009-06-14\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"CLEO/Europe - EQEC 2009 - European Conference on Lasers and Electro-Optics and the European Quantum Electronics Conference\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/CLEOE-EQEC.2009.5194810\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"CLEO/Europe - EQEC 2009 - European Conference on Lasers and Electro-Optics and the European Quantum Electronics Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/CLEOE-EQEC.2009.5194810","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Impact of lithographic irregularity across mm-scale photonic-crystal notch filters
We investigate the impact of electronic lithography writing conditions on the performances of two-dimensional grating notch filters fabricated on SiO2/Ta2O5 stack. Field stitching errors as well as electron beam writing step are considered.