微电子的可靠性

IEEE Region 5 Conference, 1988: 'Spanning the Peaks of Electrotechnology' Pub Date : 1900-01-01 DOI:10.1109/REG5.1988.15935

J.W. Meredith

{"title":"微电子的可靠性","authors":"J.W. Meredith","doi":"10.1109/REG5.1988.15935","DOIUrl":null,"url":null,"abstract":"The author points out the importance of the involvement of the design and manufacturing team in achieving reliability of microelectronic devices. A method of verifying reliability goals through calculation of failure rates based on life test parameters is described. An example illustrating the method is shown.<<ETX>>","PeriodicalId":126733,"journal":{"name":"IEEE Region 5 Conference, 1988: 'Spanning the Peaks of Electrotechnology'","volume":"374 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"71","resultStr":"{\"title\":\"Microelectronics reliability\",\"authors\":\"J.W. Meredith\",\"doi\":\"10.1109/REG5.1988.15935\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The author points out the importance of the involvement of the design and manufacturing team in achieving reliability of microelectronic devices. A method of verifying reliability goals through calculation of failure rates based on life test parameters is described. An example illustrating the method is shown.<<ETX>>\",\"PeriodicalId\":126733,\"journal\":{\"name\":\"IEEE Region 5 Conference, 1988: 'Spanning the Peaks of Electrotechnology'\",\"volume\":\"374 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1900-01-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"71\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"IEEE Region 5 Conference, 1988: 'Spanning the Peaks of Electrotechnology'\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/REG5.1988.15935\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Region 5 Conference, 1988: 'Spanning the Peaks of Electrotechnology'","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/REG5.1988.15935","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}

引用次数: 71

摘要

作者指出了设计和制造团队的参与对实现微电子器件可靠性的重要性。介绍了一种基于寿命试验参数计算故障率来验证可靠性目标的方法。给出了一个示例来说明该方法。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

查看原文

微信好友朋友圈 QQ好友复制链接

本刊更多论文

Microelectronics reliability

The author points out the importance of the involvement of the design and manufacturing team in achieving reliability of microelectronic devices. A method of verifying reliability goals through calculation of failure rates based on life test parameters is described. An example illustrating the method is shown.<>

求助全文

通过发布文献求助，成功后即可免费获取论文全文。去求助

来源期刊

IEEE Region 5 Conference, 1988: 'Spanning the Peaks of Electrotechnology'

自引率

0.00%

发文量

期刊最新文献

A diagnostic advisor Computer-aided evaluation of satellite networks in hostile environments PRF set selection for pulse-Doppler radars Modeling multiple access to a hard limiting direct-sequence spread spectrum satellite repeater using phasor analysis Parallel implementations of a branch-and-bound algorithm for the optimization of distributed database computer networks