{"title":"用激光探针测量振荡石英晶体的应力分布","authors":"I. Yasuda, S. Yamagata","doi":"10.1364/cleos.1976.wc10","DOIUrl":null,"url":null,"abstract":"A quantitative dynamic stress measuring method in oscillating quartz crystals by means of optical beam modulation is reported. The principle of the measurement is as follows: The oscillating quartz crystal is placed between crossed polarizers. The modulated light intensity is expressed by ΔI/I = Δδ-sinδ/2 sin2(δ/2), where I is the de component and ΔI is the accomponent of the modulated light intensity, respectively.","PeriodicalId":301658,"journal":{"name":"Conference on Laser and Electrooptical Systems","volume":"21 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Stress distribution measurement in oscillating quartz crystals with a laser probe\",\"authors\":\"I. Yasuda, S. Yamagata\",\"doi\":\"10.1364/cleos.1976.wc10\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A quantitative dynamic stress measuring method in oscillating quartz crystals by means of optical beam modulation is reported. The principle of the measurement is as follows: The oscillating quartz crystal is placed between crossed polarizers. The modulated light intensity is expressed by ΔI/I = Δδ-sinδ/2 sin2(δ/2), where I is the de component and ΔI is the accomponent of the modulated light intensity, respectively.\",\"PeriodicalId\":301658,\"journal\":{\"name\":\"Conference on Laser and Electrooptical Systems\",\"volume\":\"21 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1900-01-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Conference on Laser and Electrooptical Systems\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1364/cleos.1976.wc10\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Conference on Laser and Electrooptical Systems","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1364/cleos.1976.wc10","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Stress distribution measurement in oscillating quartz crystals with a laser probe
A quantitative dynamic stress measuring method in oscillating quartz crystals by means of optical beam modulation is reported. The principle of the measurement is as follows: The oscillating quartz crystal is placed between crossed polarizers. The modulated light intensity is expressed by ΔI/I = Δδ-sinδ/2 sin2(δ/2), where I is the de component and ΔI is the accomponent of the modulated light intensity, respectively.
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