J. Langston, M. Sloderbeck, M. Steurer, D. Dalessandro, T. Fikse
{"title":"硬件在环仿真测试在将新技术应用于舰船中的作用","authors":"J. Langston, M. Sloderbeck, M. Steurer, D. Dalessandro, T. Fikse","doi":"10.1109/ESTS.2013.6523785","DOIUrl":null,"url":null,"abstract":"The hardware-in-the-loop (HIL) simulation approach (both controller HIL and power HIL) potentially offers a solution to several of the challenges presented in transitioning new technology to the fleet. However, the capabilities and limitations of the approach must be carefully considered in crafting the role of these tests into an overall testing program. This paper discusses some of these considerations, along with groundwork being conducted to begin to integrate HIL testing into the overall process, discussing the role that this approach may play.","PeriodicalId":119318,"journal":{"name":"2013 IEEE Electric Ship Technologies Symposium (ESTS)","volume":"131 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2013-04-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"19","resultStr":"{\"title\":\"Role of hardware-in-the-loop simulation testing in transitioning new technology to the ship\",\"authors\":\"J. Langston, M. Sloderbeck, M. Steurer, D. Dalessandro, T. Fikse\",\"doi\":\"10.1109/ESTS.2013.6523785\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The hardware-in-the-loop (HIL) simulation approach (both controller HIL and power HIL) potentially offers a solution to several of the challenges presented in transitioning new technology to the fleet. However, the capabilities and limitations of the approach must be carefully considered in crafting the role of these tests into an overall testing program. This paper discusses some of these considerations, along with groundwork being conducted to begin to integrate HIL testing into the overall process, discussing the role that this approach may play.\",\"PeriodicalId\":119318,\"journal\":{\"name\":\"2013 IEEE Electric Ship Technologies Symposium (ESTS)\",\"volume\":\"131 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2013-04-22\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"19\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2013 IEEE Electric Ship Technologies Symposium (ESTS)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ESTS.2013.6523785\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2013 IEEE Electric Ship Technologies Symposium (ESTS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ESTS.2013.6523785","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Role of hardware-in-the-loop simulation testing in transitioning new technology to the ship
The hardware-in-the-loop (HIL) simulation approach (both controller HIL and power HIL) potentially offers a solution to several of the challenges presented in transitioning new technology to the fleet. However, the capabilities and limitations of the approach must be carefully considered in crafting the role of these tests into an overall testing program. This paper discusses some of these considerations, along with groundwork being conducted to begin to integrate HIL testing into the overall process, discussing the role that this approach may play.