用单通低温钛蓝宝石放大器以80MHz重复频率放大超短脉冲

A. Ozawa, W. Schneider, F. Najafi, T. Hansch, P. Hommelhoff, T. Udem
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摘要

近年来,越来越多的应用需要放大器系统提供高功率,短脉冲辐射与锁模振荡器的完全重复率。在频域,稳定锁模激光器的输出频谱由激光重复率分隔的等距窄线组成,通常称为“频率梳”。到目前为止,由于锁模振荡器的平均输出功率有限,通过频率梳直接驱动高度非线性过程需要特别的努力。无源腔放大器通过产生高次谐波在紫外区产生频率梳。对于这些应用,可以放大振荡器短脉冲的功率放大器将是进一步提高高重复率下可用脉冲能量的理想工具。在频率梳应用中,必须最小化从放大器中添加的额外相位噪声,以保持脉冲到脉冲的相位相干性。在时域,锁相放大器系统可以输出具有相同脉冲内电场形状的脉冲串。有了足够高的脉冲能量和短的脉冲宽度,就有可能研究载流子包络相位相关的现象,如由场电离和高谐波产生的电子发射。在这些实验中,有时有一个高重复率的系统是有利的,以便在短的测量时间内获得足够的罕见事件的统计数据。
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Amplification of ultrashort pulses with a single-pass cryogenic Ti:sapphire amplifier at 80MHz repetition rate
Recently, more and more applications require amplifier systems delivering high power, short-pulsed radiation with the full repetition rate of the mode-locked oscillator. In the frequency domain, the output spectrum of the stabilized mode-locked laser consists of equidistant narrow lines separated by the laser repetition rate, often called “frequency comb”. So far, to drive highly non-linear processes directly by frequency combs requires special efforts because of the limited average output power from the mode-locked oscillator. Passive cavity amplifiers have been built to generate frequency combs in the ultra-violet region by high-order harmonics generation. For these applications, power amplifiers that can amplify short pulses from the oscillator will be an ideal tool to further improve available pulse energy at high repetition rates. In frequency comb applications, extra phase noise that is added from the amplifier has to be minimised to preserve pulse-to-pulse phase coherence. In the time domain, phase-locked amplifier system may deliver pulse trains with identical intra-pulse electric field shape. With sufficiently high pulse energy and short pulse width, it is possible to investigate carrier envelope phase dependent phenomena, such as electron emission by field ionisation and high harmonics generation. In these experiments, it is sometimes advantageous to have a high repetition rate system to obtain enough statistics for rare events in short measurement times.
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