{"title":"无源超高频RFID标签的RCS研究","authors":"Yu Fang, Tang Bin","doi":"10.1109/ICAM.2016.7813621","DOIUrl":null,"url":null,"abstract":"The radio frequency identification (RFID) technology has been intensively studied in different frequency bands and widely deployed across various applications. In this paper, we present a new way to observe the RCS of backscattering RFID tags. The new method obtains the relationship not only between RCS and aspect angle, between RCS and frequency, but also between RCS and the size of antenna. A tag antenna with rectangular thin flat plate specifically designed for working in the ultra-high-frequency (UHF) band is used to validate the method. The numeric results show the validity of the new method which is valuable to help the design of RFID tags.","PeriodicalId":179100,"journal":{"name":"2016 International Conference on Integrated Circuits and Microsystems (ICICM)","volume":"181 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2016-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Research of RCS of passive UHF RFID tag\",\"authors\":\"Yu Fang, Tang Bin\",\"doi\":\"10.1109/ICAM.2016.7813621\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The radio frequency identification (RFID) technology has been intensively studied in different frequency bands and widely deployed across various applications. In this paper, we present a new way to observe the RCS of backscattering RFID tags. The new method obtains the relationship not only between RCS and aspect angle, between RCS and frequency, but also between RCS and the size of antenna. A tag antenna with rectangular thin flat plate specifically designed for working in the ultra-high-frequency (UHF) band is used to validate the method. The numeric results show the validity of the new method which is valuable to help the design of RFID tags.\",\"PeriodicalId\":179100,\"journal\":{\"name\":\"2016 International Conference on Integrated Circuits and Microsystems (ICICM)\",\"volume\":\"181 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2016-11-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2016 International Conference on Integrated Circuits and Microsystems (ICICM)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ICAM.2016.7813621\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2016 International Conference on Integrated Circuits and Microsystems (ICICM)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICAM.2016.7813621","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
The radio frequency identification (RFID) technology has been intensively studied in different frequency bands and widely deployed across various applications. In this paper, we present a new way to observe the RCS of backscattering RFID tags. The new method obtains the relationship not only between RCS and aspect angle, between RCS and frequency, but also between RCS and the size of antenna. A tag antenna with rectangular thin flat plate specifically designed for working in the ultra-high-frequency (UHF) band is used to validate the method. The numeric results show the validity of the new method which is valuable to help the design of RFID tags.