{"title":"嵌入式系统中的软件可靠性模型","authors":"Kapsu Kim, Chisu Wu","doi":"10.1109/STRQA.1994.526385","DOIUrl":null,"url":null,"abstract":"We propose a software reliability model for estimating, measuring, and controlling software reliability of embedded systems, and a software test stopping equation for determining software testing time. It is not easy to correct errors occurring in embedded systems on site.","PeriodicalId":125322,"journal":{"name":"Proceedings of 1994 1st International Conference on Software Testing, Reliability and Quality Assurance (STRQA'94)","volume":"89 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1994-12-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"A software reliability model in the embedded system\",\"authors\":\"Kapsu Kim, Chisu Wu\",\"doi\":\"10.1109/STRQA.1994.526385\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"We propose a software reliability model for estimating, measuring, and controlling software reliability of embedded systems, and a software test stopping equation for determining software testing time. It is not easy to correct errors occurring in embedded systems on site.\",\"PeriodicalId\":125322,\"journal\":{\"name\":\"Proceedings of 1994 1st International Conference on Software Testing, Reliability and Quality Assurance (STRQA'94)\",\"volume\":\"89 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1994-12-21\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings of 1994 1st International Conference on Software Testing, Reliability and Quality Assurance (STRQA'94)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/STRQA.1994.526385\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of 1994 1st International Conference on Software Testing, Reliability and Quality Assurance (STRQA'94)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/STRQA.1994.526385","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
A software reliability model in the embedded system
We propose a software reliability model for estimating, measuring, and controlling software reliability of embedded systems, and a software test stopping equation for determining software testing time. It is not easy to correct errors occurring in embedded systems on site.
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