{"title":"表征大规模量子器件","authors":"Joel J. Wallman, J. Emerson","doi":"10.1364/QIM.2019.S3B.2","DOIUrl":null,"url":null,"abstract":"Characterizing large-scale quantum devices is challenging because quantum noise processes are complex. We present a method for efficiently characterizing general operations in quantum devices with signal-to-noise ratios independent of the system size.","PeriodicalId":370877,"journal":{"name":"Quantum Information and Measurement (QIM) V: Quantum Technologies","volume":"21 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2019-04-04","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Characterizing large-scale quantum devices\",\"authors\":\"Joel J. Wallman, J. Emerson\",\"doi\":\"10.1364/QIM.2019.S3B.2\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Characterizing large-scale quantum devices is challenging because quantum noise processes are complex. We present a method for efficiently characterizing general operations in quantum devices with signal-to-noise ratios independent of the system size.\",\"PeriodicalId\":370877,\"journal\":{\"name\":\"Quantum Information and Measurement (QIM) V: Quantum Technologies\",\"volume\":\"21 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2019-04-04\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Quantum Information and Measurement (QIM) V: Quantum Technologies\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1364/QIM.2019.S3B.2\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Quantum Information and Measurement (QIM) V: Quantum Technologies","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1364/QIM.2019.S3B.2","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Characterizing large-scale quantum devices is challenging because quantum noise processes are complex. We present a method for efficiently characterizing general operations in quantum devices with signal-to-noise ratios independent of the system size.