{"title":"梯度通道设计无结FinFET的性能评估","authors":"S. Kaundal, Shelja Kaushal, A. Rana","doi":"10.1109/ISPCC.2017.8269706","DOIUrl":null,"url":null,"abstract":"This paper investigates the Junctionless (JL) FinFET with laterally graded channel and differentially graded channel design using TCAD simulation. It is demonstrated that differentially graded-JL FinFET (DG-JL FinFET) provides better subthreshold characteristics as compared to laterally graded-JL FinFET (LG-JL FinFET) and conventional uniformly doped-JL FinFET (UD-JL FinFET). However, the drive current is higher in LD-JL FinFET.","PeriodicalId":142166,"journal":{"name":"2017 4th International Conference on Signal Processing, Computing and Control (ISPCC)","volume":"443 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2017-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"4","resultStr":"{\"title\":\"Performance estimation of junctionless FinFET with graded channel design\",\"authors\":\"S. Kaundal, Shelja Kaushal, A. Rana\",\"doi\":\"10.1109/ISPCC.2017.8269706\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper investigates the Junctionless (JL) FinFET with laterally graded channel and differentially graded channel design using TCAD simulation. It is demonstrated that differentially graded-JL FinFET (DG-JL FinFET) provides better subthreshold characteristics as compared to laterally graded-JL FinFET (LG-JL FinFET) and conventional uniformly doped-JL FinFET (UD-JL FinFET). However, the drive current is higher in LD-JL FinFET.\",\"PeriodicalId\":142166,\"journal\":{\"name\":\"2017 4th International Conference on Signal Processing, Computing and Control (ISPCC)\",\"volume\":\"443 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2017-09-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"4\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2017 4th International Conference on Signal Processing, Computing and Control (ISPCC)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ISPCC.2017.8269706\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2017 4th International Conference on Signal Processing, Computing and Control (ISPCC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISPCC.2017.8269706","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Performance estimation of junctionless FinFET with graded channel design
This paper investigates the Junctionless (JL) FinFET with laterally graded channel and differentially graded channel design using TCAD simulation. It is demonstrated that differentially graded-JL FinFET (DG-JL FinFET) provides better subthreshold characteristics as compared to laterally graded-JL FinFET (LG-JL FinFET) and conventional uniformly doped-JL FinFET (UD-JL FinFET). However, the drive current is higher in LD-JL FinFET.