{"title":"磁对比定量纳米成像的新概念:同步加速器x射线增强扫描隧道显微镜","authors":"V. Rose, J. Freeland","doi":"10.1109/ICEAA.2010.5652963","DOIUrl":null,"url":null,"abstract":"The combination of synchrotron x-rays with scanning tunneling microscopy provides a promising new path towards the imaging of nanoscale structures with chemical, electronic, and magnetic contrast. While a scanning probe provides the high spatial resolution measuring x-ray magnetic circular dichroism allows the direct quantification of magnetic moments. This capability has the potential to broaden and deepen the general understanding of nanomagnetism.","PeriodicalId":375707,"journal":{"name":"2010 International Conference on Electromagnetics in Advanced Applications","volume":"7 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2010-12-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":"{\"title\":\"A new concept for quantitative nanoscale imaging with magnetic contrast: Synchrotron x-ray enhanced scanning tunneling microscopy\",\"authors\":\"V. Rose, J. Freeland\",\"doi\":\"10.1109/ICEAA.2010.5652963\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The combination of synchrotron x-rays with scanning tunneling microscopy provides a promising new path towards the imaging of nanoscale structures with chemical, electronic, and magnetic contrast. While a scanning probe provides the high spatial resolution measuring x-ray magnetic circular dichroism allows the direct quantification of magnetic moments. This capability has the potential to broaden and deepen the general understanding of nanomagnetism.\",\"PeriodicalId\":375707,\"journal\":{\"name\":\"2010 International Conference on Electromagnetics in Advanced Applications\",\"volume\":\"7 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2010-12-03\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"3\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2010 International Conference on Electromagnetics in Advanced Applications\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ICEAA.2010.5652963\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2010 International Conference on Electromagnetics in Advanced Applications","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICEAA.2010.5652963","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
A new concept for quantitative nanoscale imaging with magnetic contrast: Synchrotron x-ray enhanced scanning tunneling microscopy
The combination of synchrotron x-rays with scanning tunneling microscopy provides a promising new path towards the imaging of nanoscale structures with chemical, electronic, and magnetic contrast. While a scanning probe provides the high spatial resolution measuring x-ray magnetic circular dichroism allows the direct quantification of magnetic moments. This capability has the potential to broaden and deepen the general understanding of nanomagnetism.
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