集成电路安装区电磁场减小幅度对PCB辐射发射的影响

S. Haga, K. Nakano, T. Sudo
{"title":"集成电路安装区电磁场减小幅度对PCB辐射发射的影响","authors":"S. Haga, K. Nakano, T. Sudo","doi":"10.1109/EPEP.2001.967603","DOIUrl":null,"url":null,"abstract":"Radiating mechanism and reduction measures have been studied using test LSI and PCB. Among LSI operation modes, I/O buffer operation radiates the greatest amount of emission and shows that LSI mounting area behaves an opening from the electromagnetic viewpoint. The measure, decreasing extent of electromagnetic field at LSI mounting area, have been verified effective.","PeriodicalId":174339,"journal":{"name":"IEEE 10th Topical Meeting on Electrical Performance of Electronic Packaging (Cat. No. 01TH8565)","volume":"21 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2001-10-29","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":"{\"title\":\"Effects of decreasing extent of electromagnetic field at LSI mounting area on radiated emission from PCB\",\"authors\":\"S. Haga, K. Nakano, T. Sudo\",\"doi\":\"10.1109/EPEP.2001.967603\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Radiating mechanism and reduction measures have been studied using test LSI and PCB. Among LSI operation modes, I/O buffer operation radiates the greatest amount of emission and shows that LSI mounting area behaves an opening from the electromagnetic viewpoint. The measure, decreasing extent of electromagnetic field at LSI mounting area, have been verified effective.\",\"PeriodicalId\":174339,\"journal\":{\"name\":\"IEEE 10th Topical Meeting on Electrical Performance of Electronic Packaging (Cat. No. 01TH8565)\",\"volume\":\"21 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2001-10-29\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"3\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"IEEE 10th Topical Meeting on Electrical Performance of Electronic Packaging (Cat. No. 01TH8565)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/EPEP.2001.967603\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE 10th Topical Meeting on Electrical Performance of Electronic Packaging (Cat. No. 01TH8565)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EPEP.2001.967603","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 3

摘要

利用测试LSI和PCB对辐射机理和抑制措施进行了研究。在LSI操作模式中,I/O缓冲操作辐射最大,从电磁角度来看,LSI安装区表现为一个开口。结果表明,减小LSI安装区电磁场的措施是有效的。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
查看原文
分享 分享
微信好友 朋友圈 QQ好友 复制链接
本刊更多论文
Effects of decreasing extent of electromagnetic field at LSI mounting area on radiated emission from PCB
Radiating mechanism and reduction measures have been studied using test LSI and PCB. Among LSI operation modes, I/O buffer operation radiates the greatest amount of emission and shows that LSI mounting area behaves an opening from the electromagnetic viewpoint. The measure, decreasing extent of electromagnetic field at LSI mounting area, have been verified effective.
求助全文
通过发布文献求助,成功后即可免费获取论文全文。 去求助
来源期刊
自引率
0.00%
发文量
0
期刊最新文献
Model extraction and waveform correlation via a generalized frequency- and time-domain optimizer Analysis of power/ground planes by PCB simulator with model order reduction technique Measuring radiation of small electronic equipment in three-dimensional TEM cells Generalized PEEC models for three-dimensional interconnect structures and integrated passives of arbitrary shapes Equivalent circuit representation and dimension reduction technique for efficient FDTD modeling of power/ground plane
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
现在去查看 取消
×
提示
确定
0
微信
客服QQ
Book学术公众号 扫码关注我们
反馈
×
意见反馈
请填写您的意见或建议
请填写您的手机或邮箱
已复制链接
已复制链接
快去分享给好友吧!
我知道了
×
扫码分享
扫码分享
Book学术官方微信
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术
文献互助 智能选刊 最新文献 互助须知 联系我们:info@booksci.cn
Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。
Copyright © 2023 Book学术 All rights reserved.
ghs 京公网安备 11010802042870号 京ICP备2023020795号-1