E. Mehdizadeh, Xiaobo Guo, S. Pourkamali, A. Hajjam, A. Rahafrooz
{"title":"利用MEMS谐振结构进行纳米精密力和位移测量","authors":"E. Mehdizadeh, Xiaobo Guo, S. Pourkamali, A. Hajjam, A. Rahafrooz","doi":"10.1109/ICSENS.2013.6688240","DOIUrl":null,"url":null,"abstract":"This work presents a new approach for measuring sub-nano-Newton forces and sub-picometer displacements using MEMS resonators. Different versions of thermally actuated dual plate micromechanical resonators coupled to electrostatic actuators are utilized as highly sensitive force/displacement sensors. The force generated by the actuator strains the associated resonator changing its resonant frequency. Upon thorough characterization, this approach can be used as a reliable and accurate solution for force and displacement measurements in micro and nano-electromechancial systems. Frequency-force and displacement sensitivities as high as 17Hz/nN and 540 Hz/pm have been measured for the presented structures, respectively, showing the potential of such devices for sub-nanoscale force and displacement measurement resolutions.","PeriodicalId":258260,"journal":{"name":"2013 IEEE SENSORS","volume":"80 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2013-12-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"4","resultStr":"{\"title\":\"Nano-precision force and displacement measurements using MEMS resonant structures\",\"authors\":\"E. Mehdizadeh, Xiaobo Guo, S. Pourkamali, A. Hajjam, A. Rahafrooz\",\"doi\":\"10.1109/ICSENS.2013.6688240\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This work presents a new approach for measuring sub-nano-Newton forces and sub-picometer displacements using MEMS resonators. Different versions of thermally actuated dual plate micromechanical resonators coupled to electrostatic actuators are utilized as highly sensitive force/displacement sensors. The force generated by the actuator strains the associated resonator changing its resonant frequency. Upon thorough characterization, this approach can be used as a reliable and accurate solution for force and displacement measurements in micro and nano-electromechancial systems. Frequency-force and displacement sensitivities as high as 17Hz/nN and 540 Hz/pm have been measured for the presented structures, respectively, showing the potential of such devices for sub-nanoscale force and displacement measurement resolutions.\",\"PeriodicalId\":258260,\"journal\":{\"name\":\"2013 IEEE SENSORS\",\"volume\":\"80 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2013-12-19\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"4\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2013 IEEE SENSORS\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ICSENS.2013.6688240\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2013 IEEE SENSORS","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICSENS.2013.6688240","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Nano-precision force and displacement measurements using MEMS resonant structures
This work presents a new approach for measuring sub-nano-Newton forces and sub-picometer displacements using MEMS resonators. Different versions of thermally actuated dual plate micromechanical resonators coupled to electrostatic actuators are utilized as highly sensitive force/displacement sensors. The force generated by the actuator strains the associated resonator changing its resonant frequency. Upon thorough characterization, this approach can be used as a reliable and accurate solution for force and displacement measurements in micro and nano-electromechancial systems. Frequency-force and displacement sensitivities as high as 17Hz/nN and 540 Hz/pm have been measured for the presented structures, respectively, showing the potential of such devices for sub-nanoscale force and displacement measurement resolutions.