{"title":"一种改进的故障级别识别特征选择算法","authors":"Weiwei Pan","doi":"10.1007/978-981-13-9406-5_12","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":296431,"journal":{"name":"Recent Trends in Intelligent Computing, Communication and Devices","volume":"4 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"An Improved Feature Selection Algorithm for Fault Level Identification\",\"authors\":\"Weiwei Pan\",\"doi\":\"10.1007/978-981-13-9406-5_12\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"\",\"PeriodicalId\":296431,\"journal\":{\"name\":\"Recent Trends in Intelligent Computing, Communication and Devices\",\"volume\":\"4 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1900-01-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Recent Trends in Intelligent Computing, Communication and Devices\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1007/978-981-13-9406-5_12\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Recent Trends in Intelligent Computing, Communication and Devices","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1007/978-981-13-9406-5_12","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}