低延迟纠错码,以纠正卡滞缺陷和软错误

A. Asuvaran, Senthilkumar Selvaraj
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引用次数: 2

摘要

在数据传输过程中,为了保证数据的完美通信,可靠性是一个重要的因素,有时由于错误的出现而导致可靠性的缺失。ECC在不可靠的通信通道上提供可靠的数据传输。纠错码(ECCs)用于保护存储器免受软错误和卡滞缺陷的影响。单个纠错码(SEC)可以纠正每个字1位的错误,是存储器保护的典型选择。在某些情况下,SEC代码被扩展为联合提供双重错误检测,并被称为SEC- ded代码。修复熟练度通常用于缺陷,而错误纠正码用于软错误。最近,出现了一些使用纠错码来处理缺陷的建议。本文倾向于在一个软错误和一个卡滞缺陷的组合中对两个单比特错误进行校正,以减少纠错码的延迟。
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Low delay error correction codes to correct stuck-at defects and soft errors
For perfect communication during data transmission between transmitter and receiver the reliability is important factor, sometimes reliability is missed due to appearance of errors. ECC provides reliable data delivery over unreliable communication channel. Error correction codes (ECCs) are used to shield memories from soft errors and stuck-at defects. Single error correction (SEC) codes that can correct 1-bit error per word are a typical choice for memory protection. In some cases, SEC codes are extended to conjointly offer double error detection and are referred to as SEC-DED codes. Repair proficiencies are usually used for defects, whereas error correction codes are used for soft errors. Recently, some proposals are created to use error correction codes to handle with defects. In this paper tend to correct two single bit errors within the combination of one soft error and one stuck-at defect and to reduce delay of Error Correction Codes.
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