{"title":"有效提高组合电路的可测试性","authors":"Yu Fang, A. Albicki","doi":"10.1109/ICCD.1995.528806","DOIUrl":null,"url":null,"abstract":"We propose a novel testability enhancement scheme based on XOR Chain Structure. The structure is effective for improving both controllability and observability. The insertion points are selected by fast testability analysis and random pattern resistant node source tracking. Experiments with ISCAS85 benchmark circuits show that the scheme is effective. The incurred hardware overhead and performance penalty is relatively low.","PeriodicalId":281907,"journal":{"name":"Proceedings of ICCD '95 International Conference on Computer Design. VLSI in Computers and Processors","volume":"30 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1995-10-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"7","resultStr":"{\"title\":\"Efficient testability enhancement for combinational circuit\",\"authors\":\"Yu Fang, A. Albicki\",\"doi\":\"10.1109/ICCD.1995.528806\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"We propose a novel testability enhancement scheme based on XOR Chain Structure. The structure is effective for improving both controllability and observability. The insertion points are selected by fast testability analysis and random pattern resistant node source tracking. Experiments with ISCAS85 benchmark circuits show that the scheme is effective. The incurred hardware overhead and performance penalty is relatively low.\",\"PeriodicalId\":281907,\"journal\":{\"name\":\"Proceedings of ICCD '95 International Conference on Computer Design. VLSI in Computers and Processors\",\"volume\":\"30 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1995-10-02\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"7\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings of ICCD '95 International Conference on Computer Design. VLSI in Computers and Processors\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ICCD.1995.528806\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of ICCD '95 International Conference on Computer Design. VLSI in Computers and Processors","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICCD.1995.528806","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Efficient testability enhancement for combinational circuit
We propose a novel testability enhancement scheme based on XOR Chain Structure. The structure is effective for improving both controllability and observability. The insertion points are selected by fast testability analysis and random pattern resistant node source tracking. Experiments with ISCAS85 benchmark circuits show that the scheme is effective. The incurred hardware overhead and performance penalty is relatively low.
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