{"title":"具有电源和地平面的电子封装建模的一种新的有效方法","authors":"Weimin Shi, J. Fang","doi":"10.1109/EPEP.2001.967654","DOIUrl":null,"url":null,"abstract":"This paper introduces a new efficient numerical technique for the computation of fields in electronics packages with power and ground planes. This full wave approach can be conveniently integrated with circuit solvers. Skin-effect loss from metal planes and dielectric loss, together with the non-total reflections from outer edges of planes, can be easily incorporated. A special computation scheme was developed for handling vias between metal planes. Very good correlation has been achieved on printed-circuit test boards up to several GHz.","PeriodicalId":174339,"journal":{"name":"IEEE 10th Topical Meeting on Electrical Performance of Electronic Packaging (Cat. No. 01TH8565)","volume":"127 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2001-10-29","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"5","resultStr":"{\"title\":\"New efficient method of modeling electronics packages with power and ground planes\",\"authors\":\"Weimin Shi, J. Fang\",\"doi\":\"10.1109/EPEP.2001.967654\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper introduces a new efficient numerical technique for the computation of fields in electronics packages with power and ground planes. This full wave approach can be conveniently integrated with circuit solvers. Skin-effect loss from metal planes and dielectric loss, together with the non-total reflections from outer edges of planes, can be easily incorporated. A special computation scheme was developed for handling vias between metal planes. Very good correlation has been achieved on printed-circuit test boards up to several GHz.\",\"PeriodicalId\":174339,\"journal\":{\"name\":\"IEEE 10th Topical Meeting on Electrical Performance of Electronic Packaging (Cat. No. 01TH8565)\",\"volume\":\"127 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2001-10-29\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"5\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"IEEE 10th Topical Meeting on Electrical Performance of Electronic Packaging (Cat. No. 01TH8565)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/EPEP.2001.967654\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE 10th Topical Meeting on Electrical Performance of Electronic Packaging (Cat. No. 01TH8565)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EPEP.2001.967654","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
New efficient method of modeling electronics packages with power and ground planes
This paper introduces a new efficient numerical technique for the computation of fields in electronics packages with power and ground planes. This full wave approach can be conveniently integrated with circuit solvers. Skin-effect loss from metal planes and dielectric loss, together with the non-total reflections from outer edges of planes, can be easily incorporated. A special computation scheme was developed for handling vias between metal planes. Very good correlation has been achieved on printed-circuit test boards up to several GHz.