{"title":"现场加速试验条件下故障率估计的贝叶斯方法","authors":"E. Gouno, G. Deleuze, M. Brizoux, C. Robert","doi":"10.1109/ECTC.1993.346845","DOIUrl":null,"url":null,"abstract":"This paper proposes a new approach of electronic components reliability using Bayesian statistics. The purpose is to estimate the failure rate in use conditions through data from accelerated tests. Priors densities used in the model has been built with physics considerations and simulations. Furthermore, this work provided new forms of accelerated factors.<<ETX>>","PeriodicalId":281423,"journal":{"name":"Proceedings of IEEE 43rd Electronic Components and Technology Conference (ECTC '93)","volume":"67 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1993-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"4","resultStr":"{\"title\":\"Bayesian approach of failure rate estimation in field conditions through accelerated testing\",\"authors\":\"E. Gouno, G. Deleuze, M. Brizoux, C. Robert\",\"doi\":\"10.1109/ECTC.1993.346845\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper proposes a new approach of electronic components reliability using Bayesian statistics. The purpose is to estimate the failure rate in use conditions through data from accelerated tests. Priors densities used in the model has been built with physics considerations and simulations. Furthermore, this work provided new forms of accelerated factors.<<ETX>>\",\"PeriodicalId\":281423,\"journal\":{\"name\":\"Proceedings of IEEE 43rd Electronic Components and Technology Conference (ECTC '93)\",\"volume\":\"67 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1993-06-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"4\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings of IEEE 43rd Electronic Components and Technology Conference (ECTC '93)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ECTC.1993.346845\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of IEEE 43rd Electronic Components and Technology Conference (ECTC '93)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ECTC.1993.346845","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Bayesian approach of failure rate estimation in field conditions through accelerated testing
This paper proposes a new approach of electronic components reliability using Bayesian statistics. The purpose is to estimate the failure rate in use conditions through data from accelerated tests. Priors densities used in the model has been built with physics considerations and simulations. Furthermore, this work provided new forms of accelerated factors.<>
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