用高q准光谐振器测量太赫兹区表面粗糙度对电导率的影响

2011 IEEE International Vacuum Electronics Conference (IVEC) Pub Date : 2011-02-21 DOI:10.1109/IVEC.2011.5747018

Benjamin B. Yang, S. L. Katz, J. Booske

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引用次数: 1

摘要

利用高q准光谐振器在400 GHz和650 GHz频段对具有可控纳米级织构的金属样品进行了实验测量。结果探讨了表面粗糙度对太赫兹区有效电导率的影响。

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Measurement of surface roughness effects on conductivity in the terahertz regime with a high-Q quasioptical resonator

A high-Q quasi-optical resonator is used to experimentally measure metal samples with controlled nano-scale textures at 400 GHz and 650 GHz. The results explore the effect of surface roughness on effective conductivity in the terahertz regime.

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2011 IEEE International Vacuum Electronics Conference (IVEC)

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