{"title":"多层膜结构磁光常数的测定","authors":"G. J. Sprokel","doi":"10.1364/ods.1984.thcc5","DOIUrl":null,"url":null,"abstract":"A matrix relation is derived for the incident, reflected and transmitted wave vectors for a multilayer stack containing a magneto optic layer. The principle of the method is discussed in many textbooks. However, the dielectric function of a magneto optic medium is a 4th order equation and the resulting matrix is a complex 4 × 4 matrix. Here, the matrix is formulated without approximations and its properties are evaluated numerically.","PeriodicalId":268493,"journal":{"name":"Topical Meeting on Optical Data Storage","volume":"31 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Determination of Magneto Optical Constants from Multilayer Film Structures\",\"authors\":\"G. J. Sprokel\",\"doi\":\"10.1364/ods.1984.thcc5\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A matrix relation is derived for the incident, reflected and transmitted wave vectors for a multilayer stack containing a magneto optic layer. The principle of the method is discussed in many textbooks. However, the dielectric function of a magneto optic medium is a 4th order equation and the resulting matrix is a complex 4 × 4 matrix. Here, the matrix is formulated without approximations and its properties are evaluated numerically.\",\"PeriodicalId\":268493,\"journal\":{\"name\":\"Topical Meeting on Optical Data Storage\",\"volume\":\"31 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1900-01-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Topical Meeting on Optical Data Storage\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1364/ods.1984.thcc5\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Topical Meeting on Optical Data Storage","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1364/ods.1984.thcc5","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Determination of Magneto Optical Constants from Multilayer Film Structures
A matrix relation is derived for the incident, reflected and transmitted wave vectors for a multilayer stack containing a magneto optic layer. The principle of the method is discussed in many textbooks. However, the dielectric function of a magneto optic medium is a 4th order equation and the resulting matrix is a complex 4 × 4 matrix. Here, the matrix is formulated without approximations and its properties are evaluated numerically.
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