16纳米技术中FinFET与HKMG块体CMOS的比较研究:电流镜视角

B. Hesham, E. Hasaneen, H. Hamed
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引用次数: 3

摘要

这项工作的目的是比较利用FinFET和高k/金属栅极(HKMG)大块CMOS器件的各种电流镜(CM)拓扑的性能。镜像精度、输入电阻、输出电阻、合规电压、带宽、功耗等性能参数作为比较标准的指标。在FinFET和HKMG块体CMOS技术中设计和模拟了四种当前镜像拓扑。在低输入电流下,基于finfet的CMs的仿真结果显示出更好的镜像精度、更高的输出电阻和带宽以及更低的功耗。另一方面,基于HKMG本体CMOS的CM在简单CM、级联码CM、可调级联码CM和自偏置级联码CM中表现出较低的输入电阻和输入顺应电压。
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Comparative Study of FinFET Versus HKMG Bulk CMOS in 16 nm Technology: Current Mirror Perspective
The aim of this work is to compare the performance of various current mirror (CM) topologies utilizing FinFET and high-k/metal-gate (HKMG) bulk CMOS devices. Performance parameters such as mirroring accuracy, input resistance, output resistance, compliance voltage, bandwidth and power consumption are the indicators for the comparison criteria. Four current mirror topologies are designed and simulated in both FinFET and HKMG bulk CMOS technologies. For low input currents, simulation results of FinFET-based CMs show better mirroring accuracy, higher output resistance and bandwidth as well as lower power consumption. On the other hand, HKMG bulk CMOS based CMs shows lower input resistance and input compliance voltage for simple CM, cascode CM, regulated cascode CM and self-biased cascode CM.
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