{"title":"基于改进YOLOX的法兰表面缺陷检测方法","authors":"Yinghao Li, Panpan Liu, Yihao Xiang, Chengming Liu, Haogong Guo","doi":"10.1109/ICMSP55950.2022.9859056","DOIUrl":null,"url":null,"abstract":"Industrial product surface defect detection is a challenging task, In this paper, we take flange surface defect detection as the research target and propose a high-performance target detection framework to solve some problems in flange surface defect detection, such as inconspicuous features, small target scale and irregular morphology. The proposed model is based on the You Only Look Once (YOLOX) algorithm for improvement. The improved network architecture makes the model more sensitive to the details of the target by increasing the output of the backbone feature extraction network. The extraction and fusion of features is enhanced by using RFP (Recursive Feature Pyramid) and CBAM (Convolutional Block Attention Module) in the neck of the network. In addition, we compare the effect of different single data enhancement methods on the training effect and propose an enhancement method for flange surface defect data to address the problem of low defect data. Experiments show that the flange surface defect detection algorithm proposed in this paper balances accuracy and speed, outperforms existing advanced detection models, and has good detection capability.","PeriodicalId":114259,"journal":{"name":"2022 4th International Conference on Intelligent Control, Measurement and Signal Processing (ICMSP)","volume":"8 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2022-07-08","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Detection Approach Based on an Improved YOLOX for Flange Surface Defects\",\"authors\":\"Yinghao Li, Panpan Liu, Yihao Xiang, Chengming Liu, Haogong Guo\",\"doi\":\"10.1109/ICMSP55950.2022.9859056\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Industrial product surface defect detection is a challenging task, In this paper, we take flange surface defect detection as the research target and propose a high-performance target detection framework to solve some problems in flange surface defect detection, such as inconspicuous features, small target scale and irregular morphology. The proposed model is based on the You Only Look Once (YOLOX) algorithm for improvement. The improved network architecture makes the model more sensitive to the details of the target by increasing the output of the backbone feature extraction network. The extraction and fusion of features is enhanced by using RFP (Recursive Feature Pyramid) and CBAM (Convolutional Block Attention Module) in the neck of the network. In addition, we compare the effect of different single data enhancement methods on the training effect and propose an enhancement method for flange surface defect data to address the problem of low defect data. Experiments show that the flange surface defect detection algorithm proposed in this paper balances accuracy and speed, outperforms existing advanced detection models, and has good detection capability.\",\"PeriodicalId\":114259,\"journal\":{\"name\":\"2022 4th International Conference on Intelligent Control, Measurement and Signal Processing (ICMSP)\",\"volume\":\"8 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2022-07-08\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2022 4th International Conference on Intelligent Control, Measurement and Signal Processing (ICMSP)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ICMSP55950.2022.9859056\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2022 4th International Conference on Intelligent Control, Measurement and Signal Processing (ICMSP)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICMSP55950.2022.9859056","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
摘要
工业产品表面缺陷检测是一项具有挑战性的任务,本文以法兰表面缺陷检测为研究目标,提出了一种高性能的目标检测框架,解决了法兰表面缺陷检测中存在的特征不明显、目标尺度小、形态不规则等问题。提出的模型是基于You Only Look Once (YOLOX)算法进行改进的。改进后的网络结构通过增加骨干特征提取网络的输出,使模型对目标的细节更加敏感。在网络颈部采用递归特征金字塔(RFP)和卷积块注意模块(CBAM)增强特征的提取和融合。此外,我们比较了不同单一数据增强方法对训练效果的影响,提出了一种针对法兰表面缺陷数据的增强方法,以解决缺陷数据低的问题。实验表明,本文提出的法兰表面缺陷检测算法平衡了精度和速度,优于现有的先进检测模型,具有良好的检测能力。
Detection Approach Based on an Improved YOLOX for Flange Surface Defects
Industrial product surface defect detection is a challenging task, In this paper, we take flange surface defect detection as the research target and propose a high-performance target detection framework to solve some problems in flange surface defect detection, such as inconspicuous features, small target scale and irregular morphology. The proposed model is based on the You Only Look Once (YOLOX) algorithm for improvement. The improved network architecture makes the model more sensitive to the details of the target by increasing the output of the backbone feature extraction network. The extraction and fusion of features is enhanced by using RFP (Recursive Feature Pyramid) and CBAM (Convolutional Block Attention Module) in the neck of the network. In addition, we compare the effect of different single data enhancement methods on the training effect and propose an enhancement method for flange surface defect data to address the problem of low defect data. Experiments show that the flange surface defect detection algorithm proposed in this paper balances accuracy and speed, outperforms existing advanced detection models, and has good detection capability.