锑化铟在太赫兹频率下的陀螺电特性

L. Y. Tio, L. Davis
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引用次数: 4

摘要

磁化半导体的行为可以用介电常数张量来表征,它结合了欧姆电流和位移电流。描述了介电常数张量元素的频率依赖性。当半导体横向磁化到传播方向,使得微波电场垂直于外加的静态磁场(即TM模式)时,可用有效介电常数/spl epsi//sub /来描述。描述了锑化铟(/spl epsi//sub r/=17.7) /spl epsi//sub r/随频率的变化规律。推导了在简单介质和半导体界面上斜入射时的反射和透射系数,并证明了只有在正入射时才能达到无反射条件。给出并讨论了正入射时复反射系数的频率依赖性。
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Gyroelectric properties of indium antimonide at terahertz frequencies
The behaviour of a magnetised semiconductor can be characterised by a permittivity tensor, which combines the ohmic and displacement currents. The frequency dependence of the permittivity tensor elements is described. A semiconductor that is magnetised transverse to the direction of propagation such that the microwave electric field is perpendicular to applied static magnetic field (i.e. a TM mode) is described by an effective permittivity, /spl epsi//sub eff/. The variation of /spl epsi//sub eff/ of indium antimonide (/spl epsi//sub r/=17.7) as a function of frequency up to the terahertz region is described. The reflection and transmission coefficients for oblique incidence on a simple dielectric and semiconductor interface have been derived and it can be shown that a reflectionless condition is achievable only at normal incidence. The frequency dependence of the complex reflection coefficient for normal incidence is presented and discussed.
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