集成电路技术技术参数值的探索

Rodrigo Fonseca Rocha Soares, F. Sill, D. Timmermann
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引用次数: 1

摘要

集成电路技术参数的定义受到技术限制和预期应用的驱动。如果是后者,则必须考虑设计延迟、功耗和面积等相反的标准。常用的方法通常侧重于基于选择和分离细胞的分析。然而,这可能并不代表技术参数对实际设计的确切影响。因此,本工作提出了一种考虑在实际设计中的应用的技术参数值探索流程。此外,所提出的方法允许通过合理的努力对不同的技术生成进行比较。结果表明,与单细胞分析相比,预测提高了46%。此外,使用基于碳纳米管的预测技术成功评估了该方法的适用性。
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Exploration of technology parameter values of integrated circuit technologies
The definition of parameters of integrated circuit technologies is driven by technological constraints as well as by intended applications. In case of the latter, opposing criteria, like design delay, power consumptions and area, have to be considered. Common approaches focus usually on the analysis based on selected and isolated cells. However, this might not represent the exact impact of a technology parameter on actual designs. Hence, this work proposes a flow for the exploration of technology parameter values that considers the application in real designs. Additionally, the proposed approach allows the comparison of different technology generation with a reasonable effort. Results indicate an improvement of the predictions of up to 46 % in comparison to single cell analysis. Further, the applicability of the approach is successfully evaluated using a predictive technology based on Carbon nanotubes.
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