{"title":"基于运行环境替代的特高压直流保护系统现场试验技术:第一部分试验方案与硬件环境替代","authors":"Xiangping Kong, Juan Li, Wenzhe Mei, Chi Zhang","doi":"10.1049/cp.2019.0304","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":319387,"journal":{"name":"8th Renewable Power Generation Conference (RPG 2019)","volume":"117 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"The Operating Environment Substitution-based Field Test Technology of UHVDC Protection System: Part 1 Test Scheme and Hardware Environment Substitution\",\"authors\":\"Xiangping Kong, Juan Li, Wenzhe Mei, Chi Zhang\",\"doi\":\"10.1049/cp.2019.0304\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"\",\"PeriodicalId\":319387,\"journal\":{\"name\":\"8th Renewable Power Generation Conference (RPG 2019)\",\"volume\":\"117 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1900-01-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"8th Renewable Power Generation Conference (RPG 2019)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1049/cp.2019.0304\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"8th Renewable Power Generation Conference (RPG 2019)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1049/cp.2019.0304","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
The Operating Environment Substitution-based Field Test Technology of UHVDC Protection System: Part 1 Test Scheme and Hardware Environment Substitution