Yun Zeng, Hai-Qing Xie, Wei‐Qing Huang, Guo-Liang Zhang, Taihong Wang
{"title":"在土膜上制备透明电极的侧脚光电二极管的物理模型","authors":"Yun Zeng, Hai-Qing Xie, Wei‐Qing Huang, Guo-Liang Zhang, Taihong Wang","doi":"10.1142/S1793528809000040","DOIUrl":null,"url":null,"abstract":"A novel photoelectric device-Lateral PIN photodiode gated by a transparent electrode (LPIN PD-GTE) fabricated on SOI film is proposed. Its physical model is presented based on standard semiconductor equations. In this device, recombination of carriers is ignored due to its operation in depletion region and high electric field strength (E > 1 × 104V/m). Numerical calculation indicates that LPIN PD-GTE has high sensitivity and SNR (Signal to Noise Ratio). This model allows one to predict and optimize the photoelectric characteristics of LPIN PD-GTE.","PeriodicalId":106270,"journal":{"name":"Optics and Photonics Letters","volume":"32 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2009-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"13","resultStr":"{\"title\":\"PHYSICAL MODEL OF LATERAL PIN PHOTODIODE GATED BY A TRANSPARENT ELECTRODE FABRICATED ON SOI FILM\",\"authors\":\"Yun Zeng, Hai-Qing Xie, Wei‐Qing Huang, Guo-Liang Zhang, Taihong Wang\",\"doi\":\"10.1142/S1793528809000040\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A novel photoelectric device-Lateral PIN photodiode gated by a transparent electrode (LPIN PD-GTE) fabricated on SOI film is proposed. Its physical model is presented based on standard semiconductor equations. In this device, recombination of carriers is ignored due to its operation in depletion region and high electric field strength (E > 1 × 104V/m). Numerical calculation indicates that LPIN PD-GTE has high sensitivity and SNR (Signal to Noise Ratio). This model allows one to predict and optimize the photoelectric characteristics of LPIN PD-GTE.\",\"PeriodicalId\":106270,\"journal\":{\"name\":\"Optics and Photonics Letters\",\"volume\":\"32 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2009-12-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"13\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Optics and Photonics Letters\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1142/S1793528809000040\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Optics and Photonics Letters","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1142/S1793528809000040","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
PHYSICAL MODEL OF LATERAL PIN PHOTODIODE GATED BY A TRANSPARENT ELECTRODE FABRICATED ON SOI FILM
A novel photoelectric device-Lateral PIN photodiode gated by a transparent electrode (LPIN PD-GTE) fabricated on SOI film is proposed. Its physical model is presented based on standard semiconductor equations. In this device, recombination of carriers is ignored due to its operation in depletion region and high electric field strength (E > 1 × 104V/m). Numerical calculation indicates that LPIN PD-GTE has high sensitivity and SNR (Signal to Noise Ratio). This model allows one to predict and optimize the photoelectric characteristics of LPIN PD-GTE.