{"title":"使用电光光谱剪切干涉测量的高灵敏度直接飞秒脉冲测量","authors":"C. Dorrer, I. Kang","doi":"10.1109/CLEO.2002.1034471","DOIUrl":null,"url":null,"abstract":"Highly sensitive femtosecond optical pulse characterization has been performed, for the first time to our knowledge, using electrooptic spectral shearing interferometry. We report a full temporal characterization of 750-fs pulses with average power as low as 10 /spl mu/W at 156-MHz repetition rate.","PeriodicalId":332139,"journal":{"name":"Summaries of Papers Presented at the Lasers and Electro-Optics. CLEO '02. Technical Diges","volume":null,"pages":null},"PeriodicalIF":0.0000,"publicationDate":"2002-05-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":"{\"title\":\"Highly sensitive direct femtosecond pulse measurements using electrooptic spectral shearing interferometry\",\"authors\":\"C. Dorrer, I. Kang\",\"doi\":\"10.1109/CLEO.2002.1034471\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Highly sensitive femtosecond optical pulse characterization has been performed, for the first time to our knowledge, using electrooptic spectral shearing interferometry. We report a full temporal characterization of 750-fs pulses with average power as low as 10 /spl mu/W at 156-MHz repetition rate.\",\"PeriodicalId\":332139,\"journal\":{\"name\":\"Summaries of Papers Presented at the Lasers and Electro-Optics. CLEO '02. Technical Diges\",\"volume\":null,\"pages\":null},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2002-05-24\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"2\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Summaries of Papers Presented at the Lasers and Electro-Optics. CLEO '02. Technical Diges\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/CLEO.2002.1034471\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Summaries of Papers Presented at the Lasers and Electro-Optics. CLEO '02. Technical Diges","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/CLEO.2002.1034471","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Highly sensitive direct femtosecond pulse measurements using electrooptic spectral shearing interferometry
Highly sensitive femtosecond optical pulse characterization has been performed, for the first time to our knowledge, using electrooptic spectral shearing interferometry. We report a full temporal characterization of 750-fs pulses with average power as low as 10 /spl mu/W at 156-MHz repetition rate.